DR YIELD

DR YIELD has been driving innovation in yield intelligence for 20 years. Our customers benefit from improved efficiency, lower costs and increased yield with YieldWatchDog, the AI-supported, smart, flexible and high-performance software solution for semiconductor data visualization and automated process control. It’s built to solve key issues like long ramp-up cycles, hidden defects, and disconnected data environments. YieldWatchDog enables comprehensive data integration, advanced analysis and intuitive visualization of all chip manufacturing and test data. It detects critical patterns and automatically alerts users to process irregularities before they become yield-impacting problems. Using patented data aggregation technology and advanced algorithms, YieldWatchDog quickly integrates even large amounts of data into one large-scale, highly compressed database, giving teams the clarity and speed to make smarter decisions, faster. YieldWatchDog’s user-friendly and intuitive interface gives you deep insight into your data. YieldWatchDog is a customizable, fully scalable, turnkey solution that saves on engineering time and IT infrastructure costs. The New Defect Module brings inspection data into the YieldWatchDog environment. Engineers can now correlate inspection results with yield loss, tool performance, and other key metrics, all within a single, unified platform. YieldWatchDog-XI brings advanced deep learning to the mix, using neural networks and smart algorithms for intelligent pattern recognition, tool analytics, and multivariate monitoring. Our Advanced Quality Module/PAT was specifically created for our customers in automotive and other quality-critical industries, offering deep-dive analytics like value shifts, neighborhood rules, shot and stack analysis and more.