Specialist in In-Situ, In-Line and Real-Time monitoring via optical spectroscopic techniques (Ellipsometry, Raman, Photoluminescence) for the investigation of optical properties, thickness, composition, morphology, growth mechanisms, and bonding structure of nanomaterials deposited by printing or vacuum techniques. He is also an expert in the modelling of the optical properties of organic and inorganic nanostructured materials (organic semiconductors, graphene, perovskites, polymers, small molecules) and in the optical tuning and device physics of thin film Photovoltaics.