Ama Agyapong, Phd Email & Phone Number

Fremont, California, United States

University Park, Pa

State College, Pennsylvania Area

Elizabeth City, Nc

Synthesized Ta-VO2 thin films by magnetron sputtering for energy conserving smart windows application. Measured optical constants of samples using Filmetrics Thin Film Measurement System to detect reduction in VO2 semiconductor-metal transition temperature. Characterized samples using scanning electron microscopy to observe surface uniformity of thin films. Presented research at the Materials Research Society Spring 2016 Meeting, the 2015 Society for Advancement of Chicanos and Native Americans in Science Conference, and the Virginia-North Carolina Louis Stokes Alliance for Minority Participation 2015 Meeting. Each presentation resulted in an award for outstanding presentation.

State College, Pennsylvania

Grazing incident x-ray diffraction (GIXRD) method was used to identify reaction products at the interface of Ni and GeTe contacts. 110nm film of polycrystalline α-GeTe on Si substrate went through standard degreasing method with acetone, isopropanol, and deionized water prior to metallization. A 30nm thin film layer of Ni was deposited onto six samples of GeTe by electron beam evaporation. Each pair of Ni-GeTe samples were annealed at different temperatures (100, 200, and 300°C) for 30 minutes. GIXRD data peaks were identified using JADE software database. The goal of this research was to provide explanations correlating interfacial reactions to the contact performance measured by extracting specific contact and sheet resistance using the “refined” transfer length method (RTLM) on patterned Ni-GeTe samples and to explore the preferred orientation of GeTe using XRD data.

Nashville, Tn

Conducted knife edge measurements and calculated the divergence of the trapping laser beam. Assisted in optical apparatus set up to trap polystyrene beads in drosophila embryos for cell edge tension measurements and tested trapping using a confocal microscope. Authored a research paper about optical trapping for the REU program. Presented research at the 2015 Vanderbilt REU Symposium and the 2016 Emerging Researchers National Conference in STEM.

Gaithersburg, Md

Applied NIST developed through-focus scanning optical microscopy (TSOM) techniques to deviation detection of 3-D shapes in nanosized silicon semiconductor device features from the manufacturing targets. Successfully resolved variations of less than 1 nanometer in objects of less than 50 nm across measured via depths using TSOM method of lithography patterns on wafers with a bright-field microscope.

Doctor Of Philosophy - Phd, Materials Science

Activities and Societies: Materials Research Society, Penn State Chapter; Laboratory Safety Officer; College of Earth and Mineral Science.

Bachelor’S Degree, Physics

Activities and Societies: International Student Organization, Honors Program, Maximizing Access to Research Career (MARC) Scholar, Vikings.