Andrea Cester Email & Phone Number

I received the Master Degree in electronics engineering (magna cum laude), with a focus on the ionizing radiation effect on MOS devices, in 1998 and the Ph.D. degree in electronic and telecommunication engineering in 2002 from the University of Padova, Padova, Italy. My Ph.D. dissertation was focused on ultra-thin gate oxide CMOS device physics, technology, and reliability.Since December 2002, I join the Department of Information Engineering, University of Padova, as an Assistant Professor. My research activities is focused on characterisation, reliability and modelling of a wide range of devices: organic electronic devices (thin-film transistors, OLED, and solar cells); photovoltaic devices, including both silicon technologies and novel solar cell structures (thin film, organic etc.); RF-MEMS switches for reconfigurable antenna arrays; and high-mobility MOS transistors on III–V semiconductor substrate. My past interests also included reliability issues of deep submicrometer CMOS technology, breakdown and hot electron degradation of ultrathin gate oxide MOS structures, effects of ionizing radiation on ultrathin gate oxides, submicrometer and decananometer bulk and SOI CMOS devices, electrostatic discharge effects, and ionizing radiation effects in novel nonvolatile memory devices (in particular nanocrystal memory).I am official teacher of “Molecular and Organic Electronics” course, from AY 2011/2012 to presentI participated to the technical/orgainising committe of: Nuclear and Space Radiation Effects Conference; Radiation and its Effects on Components and Systems; International Reliability Physics Symposium; European Symposium on Reliability of Electron Devices, Failure Physics and Analysis;I am reviewer of: IEEE-Transaction on Electron Devices; IEEE-Transaction on Devices and Material Reliability; IEEE Transaction on Nuclear Science; IEEE-Electron Device Letters; Solid State Electronics; Microelectronic Reliability;

Listed skills include Semiconductor Device, Microelectronics, Device Characterization, Reliability Test, and 28 others.