Results oriented professional with experience in semiconductor manufacturing and defense industries. A goal oriented self-starter and recognized expert in yield improvements, continuous improvements, productivity, and leadership. Interpersonal skills with attention to details who plans in a logical and systematic manner. Proficient at utilizing the principles of Lean/Six Sigma methodologies. Areas of expertise include:• Yield Improvements• Continuous Improvements• Technology Development• Manufacturing Support• Productivity improvements• Project ManagementYield Improvement• Routinely engaged problem solving methodologies using 8D and Kepner-Tergoe Rational Process to identify problem area• Led cross-functional teams to increase yields and reduce in-line process defects in high and low volume manufacturing semiconductor facilities• Employed defect partitioning techniques to identify defect source, implement corrective actions, establish controls, and monitor improvements• Forecast defect limited yields using Monte Carlos simulation and GDS design data to estimate potential yield fallout, drive resolution and minimize yield impact• Continuous Improvement providing real-time feedback on defect issues as they occur• Correlated functional yields, inline defects, and failure analysis to identify electrical fails, to drive process improvements• Developed and implemented defect limited yield model to predict potential defect yield detractor, trigger SPC control and drive quality improvements• Established and implemented equipment controls to ensure quality control during the fabrication of integrated circuitsProcess/Continuous Improvement• Engaged and supported six-sigma and 5S quality initiatives• Held defect prevention meetings to address scrap related problems based on process, systems, or