Served as science and software leads for Vanderbilt's Radiation Effects Testbed satellite payload encompassing experiment controller, proton single event upset experiment, single event latchup experiment, and particle environment monitor.Investigated low-energy proton and muon single event upsets in highly-scaled static random access memories (SRAMs) and conducted the first observations of muon-induced errors in commercial memories.Performed proton, ion, and muon beam accelerated single event testing at Indiana University Cyclotron Facility, Lawrence Berkeley National Laboratory, Vanderbilt Pelletron, NASA Space Radiation Laboratory at Brookhaven, Texas A&M University Cyclotron Institute, and TRIUMF.Administered the CREME96 web tools for single event rate predictions on-orbit and developed CREME-MC Monte Carlo tools.Performed three-dimensional TCAD device modeling and single-event-effect simulations for aerospace, government, and commercial contracts.Developed a single event library for commercial Verilog RTL simulators.

Developed Scan Chain Verification Tools: Created Prescott (Pentium IV) tools to run at Megablock (Cell Based Design) and EBB (Embedded Block) level for Prescott Formal Verification flows.Designed interface between switch level simulator and schematic viewer. Enhanced debugging features by back-annotating values from simulator.