• Product owner of NOR product (MED). Drive yield improvement, gross margin improvement (eg. test time reduction, test program optimization) as well as maintaining product quality. • PYE/PI/PE collaboration lead for team: Approve fab changes as well as work with fab requestor on the respective project (eg. recticle change, target window optimization, queue time change, tool optimization, PAT optimization)• Bench conversion (FAT6 to um3): Worked on building base macro for conversion for bench verification.• Support customer returns: Perform data mining on FE To BE data to check for any abnormality.

Product owner of Speed Wheel/Pressure Sensor products. Drive yield improvement, gross margin improvement (eg. test time reduction, test program optimization) as well as maintaining product quality.

Product owner for 837X/PQ38S running on ultraflex tester system Drive yield improvement, gross margin improvement (eg. test time reduction, test program optimization) as well as maintaining product quality.

Successfully completed total of 20 maskset (hundreds of devices) qualification for Sendai transfer to CHD/TSMC without any loss of revenue due to Japan Earth Quake /Tsunami.Resolve and remove obstacles to ensure on time completion of deadlines. Main contact person between customer sales teams, business group teams and final man-ufacturing teams.

Driving and improving FT yields at TJN (China) and KLM (Malaysia) factories. Lead a team comprising of 8 staff (5 (KLM)/3 (TJN)) – including Black Belt Certified and Senior Member of Technical Staff (SMTS) person-nel.2010 closing ($ savings achieved):KLM = US 14.3 millionTJN = US 5.3 millionTotal = US 19.6 million2011 closing ($ savings achieved):KLM ( Q1 – US 3.85 mil, Q2 – US 10.9 mil )TJN ( Q1 – US 784 K, Q2 – US 63.3K )

Drive final test yields in KLM factory, including activities such as final test push back to probe, unit probe to class probe correlation, EWM (electronic wafer mapping), standard-izing processes (eg. Global B/I spec) and generating yield analysis recommendations re-ports.Successfully converted test program from J750 tester to Lincoln Tester (Labview based) - 2008 - was first Lincoln based test program for sensor group in KLM. Subsequently all sensor devices tested on Lincoln based tester (cheaper solution).

Ensure smooth transfer of NPI products to the factory floor.(eg. dealing with cross functional teams during NPI startup)Products handled: Mixed signal devices – sensors, e- field devices, custom ASICDigital Devices – 32/16/8 bit automotive microcontrollers.

Introduce NPI to production floor.

Ensure Final Test production line runs smoothly. (eg. yield monitoring, lot disposition, yield/test time enhancement) Products handled were standard analog op-amps.