* Managed development from inception to qualification of next generation ATE sort platform for 3DNAND and 3DXP products that was vital for achieving operational independence of NVM business group.* Engaged on fab expat assignment as technical lead on bringing up and mentoring the TD sort team on developing sort test programs for test chips on enabling new process technology and product scalability for next product line. * Developed, verified and validated sort flow functionality (periphery, array, rom, redundancy and repair) from pre silicon to post silicon of multi generational 3DNAND devices for product qualification. * Designed probe cards for manufacturing and engineering purposes that scales with increased die per wafer on each product node. Drove automation of probe card netlist file verification for quality coverage and schedule efficiency that accelerated lead time process by 50%.* Re-architected sort test program for increased modularity and use case optimizations that resulted to 30% efficiency gain that accelerated velocity for hitting product development milestones. * Architected and deployed full stack implementation of tester dashboard providing real time data visualization of tester usage that is essential for agile workflow.* Drove innovative solutions on in-house tester fleet OS upgrade with cost avoidance of $1M. Employed novel solution on increasing ratio of logic analyzer connection capacity of ATE bench platform by 4 folds increasing validation capacity by 400%.

* Managed and led a team of system engineers owning development and release of manufacturing test solutions for portfolio of SIP storage products i.e. iNAND/eMMC, SD, UFS, PPN and custom protocols. * Managed the deployment of in-house next generation manufacturing test platform for iNAND products engaging on software development, hardware validation and system integration collaborating across multiple functional teams that resulted to significant capital cost avoidance on procuring commercial testers.

* Designed and developed test software for SanDisk secured gaming product on ATE for an OEM customer. Led the test program development at different product phase from MUB emulation setup to having the actual product at hand. Resolved multiple firmware issues and implemented encryption/decryption modules for secured content loading. Successfully brought up the test system at CM site in Asia and shipped revenue products to the customer.* Designed, developed, and deployed load board hardware and test program software for PPN SIP products from new product introduction to mass production. Led the test correlation activities ranging from resolving firmware issues, developing screen to meet DPPM criteria and addressed yield issues which resulted to successful product ramp to high volume manufacturing for Tier 1 customer on a very aggressive timeline.* Designed and implemented hardware and firmware validation plan for in-house test platform system integration used on testing client PCIe SSD product for Tier 1 customer.

* Led ATE test development, characterization suite development and bench validation for NAND SLC and MLC products employing test modes for improved quality coverage, socket elimination and optimized test time.* Qualified test program via cross platform conversion from ATE system to a highly parallel in-house cost effective burn-in like system for running expensive high test time operation in resulting to cost savings on capacity capital expenditures in manufacturing.