Over 20 years of experience and leadership in automotive microcontrollers and microprocessors development, especially on innovative stress and test methodology to achieve Zero Defect automotive quality cost-effectively. Expertise and interests also include Machine Learning applications for Semiconductor manufacturing and testing, nonvolatile memory (NVM) test, software and applications, as well as fault tolerant design for emerging technologies. Strong structured problem solving capabilities as a certified Six Sigma Black Belt. Holding 32 US patents and published over 40 technical papers. Received the national Asian American Engineer of the Year (AAEOY) award in 2009. Elevated to IEEE Fellow in 2023 for contributions to test of automotive microcontrollers and microprocessors.Specialties: Automotive semiconductor product and test engineering, ML application for testing, post-silicon design validation, embedded software and applications, fault and defect tolerance, emerging nanotechnologies, microcontroller (MCU) architecture and Six Sigma problem solving.
Listed skills include Debugging, Embedded Systems, Microcontrollers, Testing, and 22 others.