Christopher Jay Soon Email & Phone Number

Torrance, Ca, Us

Torrance, Ca, Us

Chief architect and designer for Navitas multisite test platforms at Chip Probe (CP) and Final Test (FT).Defined the test methodologies and developed the complete test solution for the world's first and fastest Gallium Nitride (GaN) Power IC enabling a high-speed revolution in power electronics.

Neubiberg, München, De

- Developed complete test solutions for Multi-Chip Module (MCM), High-Voltage IC (HVIC), and High-Power Modules (uIPM and IRAM-HIP) new products. Development starts from initial specification review, test plan and methodology definition, hardware and software design, characterization and correlation, offshore production release, data-review and analysis, and documentation.- Designed PCB boards and sets of hardware for use on engineering or production, applications, ESD testing, and reliability testing. Established full ownership and responsibility of the hardware design process from schematic entry, PCB layout, components-selection and purchase, vendor-selection for PCB fabrication, assembly, troubleshooting, and release.- Designed custom circuits to address ATE test platform limitations and allow testing of complex parameters. Notable designs included the following (but not limited to):• High-power switching (up to 1200V and 50A) circuitry on IGBT modules like the IRAM-HIP with full protection and isolation. This is IR’s first attempt in testing high-power switching using an ATE solution.• High-power test system using serial communications involving the ASL1000 test system and external source meters and power supplies.• Avalanche-testing circuitry to test the avalanche parameter on MOSFET’s (inside an MCM or module). This design is used as a template on existing and future IR MCM developments.• Complete test solution for dynamic and switching tests on IGBT (inside an MCM or module). These tests include turn-on/off energy losses, diode reverse recovery energy, reverse recovery peak current, and dV/dt or dI/dt. This automated the testing for these parameters in comparison to the old manual “applications-only” testing process.• Picoammeter or I-V converter to allow testing of low-leakage parameters like IGSS.

Neubiberg, München, De

- Oversaw and supervised the offshore iPowir product and test engineering team and paved the way for several of these devices to become the company’s top-selling products including a few which received the TECPLAN award, the most prestigious award in the company.- Pioneered the implementation and defined the technical aspects of multi-site test solutions in production more than doubling the volume output without incurring extra cost compared to the old direction of acquiring more equipment to increase test capacity.- Supervised and monitored the ramp-up of new product releases on all of the company’s subcontractors in Southeast Asia including facilities in Malaysia, Thailand, Taiwan, and Philippines.- Trained and mentored test support engineers and technicians in test program optimization, yield improvement, technical troubleshooting, and data analysis.- Managed communications between corporate headquarters and local engineering team or subcontractors by defining goals acceptable to all parties and by streamlining these goals to align with both company expectations and local subcontractor culture.

- Developed in-house test solutions for various customer products ranging from Analog Switches, Current Monitors, Power Management Devices, to basic MOSFET’s. Test solutions development covered test definition, software and hardware design, and complete production support.- Developed design solutions to overcome test system limitations and extend testing capabilities on any type of devices. Designs developed include integrator-based picoammeter, parallel-port-based interface and configuration board to in-house-developed programmable sources.- Provided extensive support on in-house testing of customer solutions with emphasis on meeting time-critical schedules while maintaining quality.- Provided mentorship to group members as Team/Group Leader on technical issues and on the whole cycle of product development. Evaluated group members based on responsibility and dedication, and made necessary recommendations to the test development manager.- Co-developed a proprietary testing solution that involved the use of multiple handlers (4 handlers or “quad-site” solution) on a single tester (Credence Visual ATE), with a pseudo-parallel type of operation. This concept multiplied the output by almost 4 times (or “n” times depending on the number of handlers and is hailed by Credence as the best innovation for a TMT tester.- Designed the official MOSFET Gate Resistance test solution and methodology used in the above quad-site solution.- Co-defined the overlay software used in the above solution. This software has the following features: multi-site display on a single screen, complete functionality of the original software, auto-loading of programs with a database back-end, and many more.- Consultant for the IT group on web development and programming. Defined the objectives and requirements for intranet web-based applications.

San Jose, Ca, Us

- Developed test package (software and hardware for both Wafer Sort and Final Test) for several new products with applications in Analog Gate Switches, Fiber Optics, Battery Chargers, and Battery Management for various package types including uCSP, uMAX, QFN, SOT23, SC70, and etc.- Increased production capacity of several analog products by reducing test time, eliminating flows, and transferring products from one test system to another.- Provided extensive production line support on products that needed immediate attention by evaluating the root cause of the problem and working with design engineer to find the solution to avoid similar problems from re-occurring.- Consultant for Fiber Support Group. Involves managing and training of staffs to meet time-critical goals or projects and to address immediate production issues.- Trained at Maxim Headquarters, Sunnyvale, CA on Analog Switches and Battery Management test development from July 2000 to December 2000. Also trained at Maxim North, Hillsboro, Oregon on Fiber Optics test development from July 2001 to January 2002.- Designed, administered, and maintained the Test Development Group (TDG) server implemented on the Linux platform. This includes regular maintenance, back-up and tune-up.- Developed and maintained group intranet file server with capability for remote FTP transfers and full-sharing with the Windows environment through Samba.- Creator and developer of the TDG Webpage with features including: • TDG Online Performance to Goals – a Maxim-worldwide portal for weekly/quarterly updates on performance to goals for every test development engineer. • Holds Monitoring and SPC – a real-time holds monitoring tool with statistical analysis capabilities. • Online Signup Sheets – daily online test system, handler, equipment, and engineering aide sign-up sheets. • Miscellaneous Tools – this includes yearly calendar and stock chart plot.