Christopher Jay Soon Email & Phone Number

Torrance, CA, US

Torrance, CA, US

Chief architect and designer for Navitas multisite test platforms at Chip Probe (CP) and Final Test (FT).Defined the test methodologies and developed the complete test solution for the world's first and fastest Gallium Nitride (GaN) Power IC enabling a high-speed revolution in power electronics.

Neubiberg, München, DE

• Developed complete test solutions for Multi-Chip Module (MCM), High-Voltage IC (HVIC), and High-Power Modules (uIPM and IRAM-HIP) new products. Development starts from initial specification review, test plan and.
• High-power switching (up to 1200V and 50A) circuitry on IGBT modules like the IRAM-HIP with full protection and isolation. This is IR’s first attempt in testing high-power switching using an ATE solution.
• High-power test system using serial communications involving the ASL1000 test system and external source meters and power supplies.
• Avalanche-testing circuitry to test the avalanche parameter on MOSFET’s (inside an MCM or module). This design is used as a template on existing and future IR MCM developments.
• Complete test solution for dynamic and switching tests on IGBT (inside an MCM or module). These tests include turn-on/off energy losses, diode reverse recovery energy, reverse recovery peak current, and dV/dt or dI/dt..
• Picoammeter or I-V converter to allow testing of low-leakage parameters like IGSS.

Neubiberg, München, DE

- Oversaw and supervised the offshore iPowir product and test engineering team and paved the way for several of these devices to become the company’s top-selling products including a few which received the TECPLAN award, the most prestigious award in the company.- Pioneered the implementation and defined the technical aspects of multi-site test solutions.

- Developed in-house test solutions for various customer products ranging from Analog Switches, Current Monitors, Power Management Devices, to basic MOSFET’s. Test solutions development covered test definition, software and hardware design, and complete production support.- Developed design solutions to overcome test system limitations and extend testing.

San Jose, CA, US

• Developed test package (software and hardware for both Wafer Sort and Final Test) for several new products with applications in Analog Gate Switches, Fiber Optics, Battery Chargers, and Battery Management for various.
• TDG Online Performance to Goals – a Maxim-worldwide portal for weekly/quarterly updates on performance to goals for every test development engineer.
• Holds Monitoring and SPC – a real-time holds monitoring tool with statistical analysis capabilities.
• Online Signup Sheets – daily online test system, handler, equipment, and engineering aide sign-up sheets.
• Miscellaneous Tools – this includes yearly calendar and stock chart plot.