Product Engineer
Houston, Texas
Held responsibility for production engineering and yield improvement supports on Analog IC production devices. Analyzed low-yield materials, using variety fault isolation methods, data analysis tools, and failure analysis techniques to isolate the failure mode and correlated the failure to in-line process steps or equipment set. Interfaced with process engineering and Quality Assurance teams to address yield, quality and reliability, customer return issues. Partnered with engineers to provide wafer fab supports on final yield issues relating to production processes. Utilized UNIX, Exceed10, Spotfire, DataPower, Slot Tracker, and EagleView analytical tools.- Implementing Statistical Yield Outlier Control limits (Six Sigma program) to improve product quality.- Completed LabView Core1 training from National Instruments IncDSP Production Test Engineer, 1995-2001Texas Instruments Inc. Houston, TexasPerformed chip-level characterization and qualification tests for DSP devices. Utilized Polaris and MegaOne tester platforms. Interfaced with design, packaging, fabs, failure analysis, quality assurance, and engineers to address low-yield issues. Verified failure mode of customer returns.- Troubleshoot device issues and work with failure analysis team to identify root-cause of failures- Debug test programs for new spin-off devices. DSP Failure Analysis Team Leader, 1993-1995Texas Instruments Inc., Houston, Texas- Support engineering groups in product, design, and quality assurance projectsFailure Analysis Laboratory, FA Analyst, 1992-1993Texas Instruments Inc. Houston, Texas