My work in industry at SolAero involved upgrading solar cell electrical testing capacity, based on a faster source measure unit (SMU), compared to a reference, and validated the SMU using JMP. By using JMP statistical data analysis, results showed that the solar cell metrics of the faster SMU were typically within 1% compared to the reference, suggesting that the faster SMU was accurate enough to replace the slower reference SMU. At SolAero, I also upgraded and validated spectroscopic instrumentation.In my postdoctoral research, I designed, developed, and implemented processes and procedures for solar cell electrical device characterization methods of current-voltage and capacitance-voltage . This involved the design of LabVIEW programs to read impedance, phase angle, temperature, voltage, frequency, and time measurements and subsequently write this data to Excel files. I also upgraded an existing current-voltage sweep LabVIEW program to measure solar cell device performance metrics and perform cell biasing for accelerated stress testing. The LabVIEW data was then collected and analyzed for data analysis of physical measurements (i.e. open-circuit voltage or semiconductor doping). I then developed operating processes and procedures, for use of the instrumentation, and trained users on these procedures.My PhD research at the University of Delaware focused on improving the open circuit voltage (Voc) of thin film CdTe semiconductor/photovoltaic devices by developing a thinner CdTe layer (reduced defects) and evaluation/fabrication of alternative electrical contact materials to the CdTe surface as a means of controlling the device Fermi level and developing an ohmic contact. This research involved semiconductor characterization and failure analysis by 1.) analyzing solar device performance data (efficiency, Voc, Jsc, and fill factor) and 2.) characterizing devices based on performance data using the following tools: capacitance-voltage and drive-level-capacitance profiling (CdTe doping), current-voltage temperature (CdTe/contact barrier energy), device-spectral-response (photocurrent losses), SEM/FIB (CdTe and contact layer uniformity), as well as optical characterization of an organic (PCBM) contact material via ellipsometry and UV-vis.