David Adams Bsee / Mba Email & Phone Number

Austin, TX, US

Chandler, AZ, US

Advantest V93000 test applications for MEMS clock + ASIC stacked package parts.

Scottsdale, Arizona, US

• Earned 2022 Bravo award for characterization of at-speed MIPI serial interface at 1.25Gbps. (High-speed signal integrity validation) Presented data on the root cause of ATE speed limitations, corrective action, and.
• Project Lead for mixed signal test hardware design and software development on Teradyne IP750 for automotive image sensors including Safety & Security I/Ps.
• Developed, debugged & supported test programs from new product introduction phase to high volume manufacturing.Applied problem-solving skills;
• redesigned probe cards for an image sensor application, changing power distribution on the card with dramatically improved test performance. This improved test yield by removing false fails at standby current.
• designed multi-site parallel vertical technology probe cards for high-volume production.
• replaced a package test program, improved image capture quality an order of magnitude and achieved a huge yield improvement.

Consulting for GLG clients in the field of semiconductor test engineering, software process improvement and related services including data analytics. Extracting value from data analytics for product characterization, correlation, process control, test cost optimization and yield improvement. Identifying root cause of pain points within engineering.

London, GB

• Note: BAE Systems acquired Fairchild Imaging in 2011.ATE test development for advanced high-performance scientific CMOS image sensors achieving nearly 16-bit dynamic range. Design probe cards with ADC circuits to.
• read noise
• fixed pattern noise (FPN)
• full well capacity (FWC).Skills Acquired: Teradyne IP750, GNU Octave programming (an open-source alternative to MATLAB)

Neubiberg, München, DE

* Infineon Info: Did you know that most automobiles contain more than 25 Infineon chips?Designed Teradyne J750 ATE test interface hardware and developed test programs for MEMS mixed-signal CMOS ASICs.Developed reliable high-performance test solutions which provide optimum throughput, yield, and cost for Infineon.Developed unique test flows for NPI.

• Designed new products and prepared and filed patent applications.
• Performed comprehensive prior art searches for intellectual property.
• Mastered patent law fundamentals per the USPTO Manual of Patent Examination Procedure.

Beaverton, OR, US

• Planned, designed and implemented electrical semiconductor test solutions including both hardware and software in compliance with military specifications and customer overscreen requirements. Test plan development.
• Exceeded objectives on test package deliverable items for aggressive year-end customer commitments.

• Grenitech, Inc. turns ideas into viable businesses by semi-automating business processes (enables creation of corporations by providing essential support systems for core business operations.)
• Developed a strategic intellectual property management plan, creating a software driven process flow for guiding intellectual property management based on the current legal environment and positioning to take advantage.
• Created tools for web site traffic generation.

Austin, TX, US

• Created test applications for microchip characterization across operating voltage & temperature.
• Streamlined test development for a family of DDR DRAM memory by implementation of modular code.
• Translated Flash memory test patterns from Advantest to Verigy tester format.
• Maintained project management interface with customers.
• Developed applications on Teradyne, LTXCredence, Verigy V5500 test platforms.
• Developed characterization test flow for DC parameters and functional test patterns.

Toronto, Ontario, CA

• Obtained Department of Defense customer qualification acceptance of Celestica software development processes via written presentation, verbal communication, and demonstration.
• Advised Test Engineering team on reduction of false fails, improving repair loop, & reducing production line down time.
• Negotiated cost savings on maintenance contracts.
• Created return-on-investment analysis and cost justification for capital equipment acquisitions.

Austin, Texas, US

• Project Lead on test development for dual core HC12 automotive microcontroller / processor.
• Implemented successful cost reduction via platform conversion, parallel test, and run time reduction.
• Transitioned product into high volume production test w/ dramatically reduced costs.
• Integrated hardware & software and perform statistical test data correlation.
• Developed Perl scripts for test pattern conversion.
• Converted code from C language to Visual Basic implementation.

Mba, Management

Education record

Education record

Bs, Electrical Engineering

Object Oriented Programming In C++

Python Programming