David Bement Email and Phone Number

Manage and grow Test Engineering group focusing on NXP's fast growing Connectivity products, including new UWB precision positioning solutions, WiFi+BT combo devices in the IoT and entertainment space. Focus on driving new test solutions for higher quality test, increased parallelism and reduced costs, across worldwide geographies and within accelerated bringup schedules.

Managed, mentored, and grew a world class team of up to 17 Automatic Test Equipment (ATE) Test Engineers in Broadcom's Connectivity, Mobile/Wireless, and Custom ASICs groups. My team developed ATE HW/SW for several generations of the company's extremely high volume, business-critical wafer level WLAN/BT/FM combo devices which are present in the majority of the world’s high-end smart phones and tablets. These high-visibility devices were consistently top 5 volume and revenue devices for the company, all shipping several hundred million units and some exceeding $1B lifetime revenue.Consistently drove test costs down and yield up through industry leading, cutting edge multi-site solutions all the while improving quality of test by orders of magnitude with putting into production performance level tests versus legacy tone-based measurements. Worked closely with the Design Verification and Systems teams to address any gaps in test coverage or customer support issues. Regularly presented all test-related Operation issues/status to the heads of each Business Unit.Conceptualized and drove the creation and final implementation of the ATE industry’s first built-in Real Time Audit toolset at both Teradyne and Advantest which audits the ATE test program and helps eliminate program-related voltage/current/power overstress, thereby protecting the device under test (DUT) and sensitive RF ATE hardware.Authored custom software tools for monitoring daily overseas tester loading, volume, production yields, throughput, test costs, and other metrics, plotting them in a variety of customizable ways for senior management and project management.

Developed HW/SW multi-site production ATE solutions for Broadcom's WLAN and BT devices on Teradyne's Catalyst, iFLEX, and UFLEX test systems. Successfully qualified, characterized, and productized numerous very high volume, industry leading devices including standalone WLAN radio/basebands, BT radios/basebands, and fully integrated WLAN/BT combos. Took full responsibility for manufacturability of the entire test solution, steadily improving yield and reducing test time to keep test costs down.

Provided on-site support for very large, prominent Dallas semiconductor giant and their Hard Disk Drive test development team. Worked with customer's test engineering team one on one on Teradyne's A5xx and Catalyst testers instructing them on proper test development techniques, helping them to debug their programs, improve multi-site efficiency, and reduce test time. Acted as primary interface between customer and Teradyne factory on HW/SW bugs and drove issues to successful resolution and completion. Successfully converted a high volume disk drive servo device to multisite on the A567 platform more than doubling throughput and cutting test cost in half.

Developed a full ATE In-Circuit Test solution including hardware and software on Teradyne's Z18xx family of in-circuit testers as part of the company's Test Programming Services group. Delivered the solution on-site to customers throughout North America, performed checkouts/audit procedures, and trained operators to begin and sustain production. Worked closely with the engineering team to obtain buy-off and drove project to a successful conclusion.Instructed 2 week training courses on Z18xx HW/SW to new and existing customers and reinforced presentation material with instructor-led lab work.