* Providing R&D solutions to existing or upcoming products* Products in the form of gadgets / investigation systems / processing systems* Solutions in the form system design or computations / simulations or advanced data analysis

Working on Fundamental Research for upcoming technologies

Development of various x-ray scattering techniques at synchrotron sources or FEL (Free Electron Laser) sources.

Involved in investigation of structural properties of various nanomaterials, thin films using x-ray diffraction, in particular grazing incidence x-ray diffraction at synchrotron source.

I was involved in developing strategies to calibrate very fast (4.5 MHz) DEPFET based area (2D) detector for the upcoming X-ray Free Electron Laser at Hamburg, Germany. The work involved system simulation of various physical as well as electronic properties of the 2D detector as a whole.

Development of experimental and theoretical methodology to reconstruct surface morphology (profile) from coherent x-ray reflectivity measured at BESSY-II synchrotron at Berlin, Germany. Coherent measurements are generally performed using monochromatic x-rays at synchrotron source and in transmission geometry. Ours was the only attempt to measure coherent scattering using white x-rays in reflection geometry. The developed technique can serve as a complementary technique to conventional AFM… Show more Development of experimental and theoretical methodology to reconstruct surface morphology (profile) from coherent x-ray reflectivity measured at BESSY-II synchrotron at Berlin, Germany. Coherent measurements are generally performed using monochromatic x-rays at synchrotron source and in transmission geometry. Ours was the only attempt to measure coherent scattering using white x-rays in reflection geometry. The developed technique can serve as a complementary technique to conventional AFM (Atomic Force Microscopy) and can provide surface height information at submicron level. Furthermore the beauty of this technique is that it can investigate sample surface over a length scale of few mm whereas AFM can scan lateral distance only few microns. Show less

Development of a technique to measure size and distribution of nanoparticles using enegy dispersive small angle x-ray scattering at BESSY-II synchrotron at Berlin, Germany.

Taught Applied Physics.

Involved with the development of moisture sensor using polymers to measure moisture level ofrubber casings.