Daniel Baumbach Email & Phone Number

Folsom, California, United States

• I have taken a leadership role in the complete physical failure analysis process of NAND memory packaged units, with a primary focus on identifying and isolating specific failures. My demonstrated expertise spans.
• Helios Dual Beam Focused Ion Beam (FIB): Experienced in performing targeted single bit Dual Beam FIB cross-sections for in-depth analysis. This includes Planar (P-TEM) and X-TEM Transmission Electron Microscope (TEM).
• Proficient in managing High-Value Inventory and Confidential Intellectual Property
• Work in Progress (WIP) Management: Created and managed a WIP queue within SharePoint to efficiently track and prioritize ongoing projects.
• Knowledge Sharing: Designed and led workshops to share knowledge and techniques with team members, thereby enhancing the capabilities of the laboratory.
• IREM/OBIRCH Sample Preparation: Skills in preparing samples for IREM (Infrared Emission Microscopy) and OBIRCH (Optical beam induced resistance change).

Folsom, California, United States

I have a proven track record in the development of Focused Ion Beam (FIB) sample preparation methods, showcasing my skills in writing Best Known Methods (BKMs), creating training documentation, and providing remote cross site training during the Covid shutdowns. My areas of expertise include Transmission Electron Microscopy (TEM) sample preparation of a.

Santa Clara, California, United States

I played a crucial role in advancing next-generation server processor development through my expertise in Focused Ion Beam (FIB) circuit edit debug. My responsibilities also included FIB troubleshooting, managing consumable inventory, calibrations, and routine maintenance of essential tools.In addition to my technical work, I thoroughly documented my.

San Jose, California, United States

Responsible for conducting a comprehensive failure analysis process on prototype hard disk drives. This process included tasks such as clean room disassembly, thin film media metrology, scanning electron microscope (SEM) imaging with energy-dispersive X-ray spectroscopy (EDS), and focused ion beam (FIB) cross-sectioning. Furthermore, I generated failure.