Dr. Edgar Leone has a wide range of experience in the application of advanced surface analytical techniques for industrial problem solving and materials characterization.Ed earned his MS and PhD degrees in Ceramics and Material Science from Rutgers University while working for AlliedSignal, which later merged with Honeywell. As a Principal Scientist in Honeywell’s Analytical Science Laboratory, Ed was responsible for the Surface Analysis, Optical, and Electron Microscopy Groups.With over 30 years at Honeywell, Ed gained extensive experience in root cause failure analysis and industrial problem solving methods, and has numerous accomplishments in the Automotive, Aerospace, Polymer, and Engineered Plastics industries. He has broad technical expertise in XPS, Auger, ToF-SIMS, AFM, SEM, EDX, WDX and other surface and microscopy techniques. Ed is widely published, authoring a number of articles on a wide range of topics, and was co-author of a number of chapters in the book, Guide to Materials Characterization, and has made numerous presentations at professional meetings.Specialties: Industrial Problem Solving and Failure Analysis