Eric St Pierre Email & Phone Number

Chandler, Az

Currently leading a team that is building solutions which influence factory decision making by integrating yield sustaining reports with drill down analytics so questions from managers to engineers can be answered in real time. This reduces the amount of time to fix problems and is work content reduction for the factory. Co-developed one of the most frequently used data mining tools in Intel factories, for which we received Intel’s 2nd highest achievement award.Business analyst representing Intel factories in collaborations with machine learning experts to find areas of opportunity for implementing deep learning to solve problems in manufacturing such as large scale image classification. Team received Intel's 3rd highest level award.10 nm Yield Opportunity owner. Identified a significant number of yield improvement opportunities using advanced analytics to help Intel factories achieve records yields. Worked with teams to realize these opportunities using advanced process control, improved targeting, process changes, and changes in production practices.14nm Server Yield Roadmap owner. Lead an engineering team that identifies opportunities to improve the manufacturing process. For the past 3 years the team has produced record yields on our server product families by implementing yield positive process changes.Influenced senior management to create a Data Systems Group to provide analysis tools utilizing machine learning methods and modern storage technologies to reduce the time required to ramp yields of new manufacturing processes. Partnered with a senior software engineer to create an analysis tool which can extract and analyze deep and wide data sets to search for yield signals. The tool rapidly gained in popularity due to reducing the time required from several hours on a workstation to a few minutes on a conventional lap top.

Phoenix, Arizona Area

22 nanometer yield roadmap owner. Achieved record yields on Intel's 22 nanometer process technology through leading cross functional team of integration, process, failure analysis, and yield analysis engineers. Set direction and cadence for 42 yield improvement projects. Team was honored with 5 factory awards in recognition of improved process yield.Created and taught 10 week graduate level course on modern statistical methods through Intel's College of Engineering. Curriculum covered CART, serial and parallel tree ensembles, and feature selection. Course used Blackboard and LYNC distance learning software tools to deliver the class to Intel's worldwide work force. Course routinely received high evaluation marks from students.32 nanometer transistor performance improvements. Used feature selection and cluster analysis to identify process variables that were impacting transistor threshold voltage and drive current. Results of analysis drove process target changes that resulted in bin split gains for performance products.Led software developers and data extraction experts in creating a solution to be able to extract deep and wide data sets easily and store them in a format quickly imported into analysis tools. Received Intel's 3rd highest award for this work.Partnered with Oracle data base administrators to improve the performance of one of the largest tables in the schema. Result was a reduction in run time from 20 hours on volume test scripts to 1 hour, achieved through much improved indexing.Honored with publication in IEEE Transactions on Semiconductor Manufacturing. Paper was on an innovative use of rule induction to identify tool commonality.Honored with publication in Industrial Conference on Data Mining proceedings. Was selected as 1 of only 24 papers (104 submissions) for publication. Paper described an inventive application of feature selection for yield analysis.Awarded a patent.

Phoenix, Arizona Area

Invented a spatial pattern recognition tool to search thousands of wafer maps and group wafers with similar fail patterns. Significant productivity increase as a task which formerly took 2 days was now completed in minutes.Created a data mart for SAS users which was the backbone for yield, performance, and reliability analysis at Intel's high volume manufacturing facility in Chandler, AZ. This was done by leading a team of self taught yield engineers who learned how to create and administer a SQL Server data base, install and sustain servers and a SAN, and set up and maintain a web server. In 2007, the system ran 1,000 jobs a month for about 40 users and processed over 300 hours of analysis per month. The platform enabled many innovations that had Intel wide impact including bin split modeling, reliability prediction, spatial fail pattern detection, and multivariate control charts for FDC data.Reduced transistor performance variability 3% by finding sources of cross reticle, cross wafer, and cross lot variability using linear models. Worked with engineers to design experiments to determine new process targets and validate results found through data mining.Honored with best paper award at International Reliability Physics Symposium. Paper was on an industry leading approach to convert from wafer level reliability scrap limits to die level reliability scrap limits which increased output without reducing reliability.

Phoenix, Arizona Area

Led effort to introduce process control to Intel's Sort facilities. Convinced senior management to provide people and resources for the effort through pilot examples. Membership and project budget increased from 9 people and $0 in 1998 to 22 people and a $200K budget in 1999. Result was improved tester matching, increased utilization and decreased cost by reducing the number of setups required, and reduced resort rate due to intelligently selecting what wafers would gain upon resort.

Phoenix, Arizona Area

Taught Design of Experiments and SPC to engineers through Intel University.Designed and analyzed experiments with engineers to validate process changes.Member of change control board. Consultations with senior factory management regarding decisions on process changes.

Master Of Science (M.S.), Statistics

Bachelor Of Science (B.S.), Industrial Engineering