Experienced physicist with 10+ years in material science and surface characterization. Vast experience in experimental control, data analysis and interpretation.Extensive experience in transistors and diodes packaging, electrical testing and preparing of technical documentation. Responsible for device reliability testing, quality control of diced wafers, and clean room supply management. Proven experience in materials science working in the area of thin film growth and its characterization at ambient and ultra-high vacuum conditions using AFM, STM, XPS and other destructive and non-destructive surface sensitive methods. Analyzed, interpreted and organized data, wrote reports, and presented results to groups and at conferences. Excellent computer and networking skills. Experienced preparing 3D drawing by CAD software and 2D drawing by MS Visio. Skilled with MS Word, Excel, PowerPoint. Working effectively both as a team player and independently. Ability to multitask while providing accurate and timely information. Self-starter and willing to learn with excellent communication skills.