Metrology manager to a team of high-performing engineers.2022: Coached the team to produce 3 papers which were accepted in technical journals and seminars.Took on the responsibility of leading 2 engineers to develop new applications of FOAK FIB toolsThermofisher PXL and EXL. Successfully delivered multiple in-line detections and innovations from2022 onwards.2021: Continued focus on breakthroughs and innovations to enable in-line detections for NAND… Show more Metrology manager to a team of high-performing engineers.2022: Coached the team to produce 3 papers which were accepted in technical journals and seminars.Took on the responsibility of leading 2 engineers to develop new applications of FOAK FIB toolsThermofisher PXL and EXL. Successfully delivered multiple in-line detections and innovations from2022 onwards.2021: Continued focus on breakthroughs and innovations to enable in-line detections for NAND 150Sproduct.Coached the team to produce 2 papers which were accepted in technical journals and seminars.2020: Transitioned with my team to oversee metrology solutions for Microns' latest 150S RGNAND.Worked with the team to successfully execute technology transfer of 150S from tech dev (TD) in theUSA.Leading the team to oversee, optimize and innovate cutting edge solutions to meet the challenges ofinline detection for complex processes throughout the life cycle of 150S RGNAND from NPI to ramp tomature yield.Successfully acceptance of 2 technical papers in our seminar.2019: Led the team to oversee, optimize and innovate on leading edge metrology solutions forbackend of line (BEOL) processes in Microns' first reverse gate (RG) NAND product in the new productintroduction (NPI) phase.Successful acceptance of 3 papers in technical seminars or journals. Show less

Key achievements include:- Authoring technical paper on the usage of machine learning to measure pillar etch misalignment;paper was selected for oral presentation in a technical seminar.- Successful technology transfer of 140S RGNAND pillar and cell metrology from US F4 to SingaporeF10N.

Further broadened my range of responsibilities to take on Optical Metrology and CD-SEM metrology applications development on top of existing AMI responsibility. Key achievements include:- Authoring technical paper on composite metrology to detect control gate recess length. - Development of back scattering electron (BSE) detection to enable inline process tuning of dual damascene contact etch process enabling yield loss avoidance. - Part of pioneering team of 4 optical… Show more Further broadened my range of responsibilities to take on Optical Metrology and CD-SEM metrology applications development on top of existing AMI responsibility. Key achievements include:- Authoring technical paper on composite metrology to detect control gate recess length. - Development of back scattering electron (BSE) detection to enable inline process tuning of dual damascene contact etch process enabling yield loss avoidance. - Part of pioneering team of 4 optical CD (OCD) applications trained engineers on the ONTO atlas equipment. - Co-authored technical paper on use of Nikon AMI intensity for inline film thickness measurement. A FOAK technique that enables full-wafer thickness characterisation in seconds. Show less

Transitioned roles to take on dual-responsibility as Metrology equipment and process owner. Key achievements include:- Successful move-in and release of FIRST-OF-A-KIND (FOAK) equipment in Micron F10N; the Nikon AMI-3500.- Pioneered applications development for Nikon AMI in Singapore. - Successful development of FOAK application on the AMI to detect arcing damage on wafers with fast and effective sampling for dry etch interdiction. - Awarded Micron SPOT bonus for the above… Show more Transitioned roles to take on dual-responsibility as Metrology equipment and process owner. Key achievements include:- Successful move-in and release of FIRST-OF-A-KIND (FOAK) equipment in Micron F10N; the Nikon AMI-3500.- Pioneered applications development for Nikon AMI in Singapore. - Successful development of FOAK application on the AMI to detect arcing damage on wafers with fast and effective sampling for dry etch interdiction. - Awarded Micron SPOT bonus for the above detection. - Took on responsibility as Micron-Intel Technology Transfer Engineer Show less

Started my career as a Metrology Equipment Owner for a fleet of 10 and growing AMAT CD-SEMs.Key achievements include working with supplier to:- reduce wafer breakage due to chuck issues- eliminate water leakage from equipment resulting in downtime and safety issues- maintainence of 95% uptime and equipment performance across time via metrics like matching and defectivity.

Reservist Battalion Senior Medic

Reservist Battalion Senior Medic

Reservist Battalion Senior Medic

Reservist Battalion Senior Medic

Research on dry liquids.Co-first-authored a paper on dry ionic liquids for CO2 absorption.Co-inventor of patented method for regeneration of CO2 absorbing ionic liquids.

Research on superhydrophobic coatings and porous materials.Co-authored a paper on tuning morphology of MIL-53 for superhydrophobicity.

Monitoring of work site progress for the reconstruction of pipelines.

Active duty. Awarded Silver Bayonet for 2nd Best Trainee in the SAF SMTI Combat Medic Specialist II Course.Managed medical center during H1N1 outbreak.Deployed for active duty at key installations.