Harshvardhan Patel Email and Phone Number

• Handling multiple product yields at Functional and Module final tests for higher SiGe technology nodes. • Ownership of functionally tested scrap analysis as a part of continuous yield improvement. • Working with fab Process team, Test team and Failure Analysis team to improve product yield.• Regularly contributed to top key client meetings which involve technical discussions on various problem-solving work.• Representing Functional Yield team to interface with one of the high volume 180 nm CMOS technology clients• Represented Functional Yield team on multiple occasions in MRBs and yield related project meetings

• Inline Defect Analysis – Responsible for wafer defect review and Baseline monitoring of various defect modes.• Inline Electrical Test and Characterization - Supported higher node CMOS and BiCMOS technologies at Electrical Test and responsible for hold lot disposition, root cause analysis and process improvement. • Functional Yield Engineering - Responsible for disposition of multiple functionally tested RF, Automotive and Industrial products. • Meeting with customer to review defect density trackers and work with their team to improve the process.

Purpose : understanding production assembly line, production layout and supply chain covering multiple states