Certified Principal Engineer at Lockheed Martin Space

Design and Development of Electrical components for ECLSS systems. SBIR proposal generation and execution

Hand-selected to lead team of five (5) Engineers as Technological Lead on the On-Demand Manufacturing of Electronics project and direct technology development at NASA, including partnering with industry and university SMEs. Delivered several innovations that improve additive electronics manufacturing capabilities. Some Key Impacts Include:◼Identified as Subject Matter Expert (SME) by NASA in the field of additive manufacturing for electronics◼Won NASA’s Innovation Award for 4 patents relating to additively manufactured moisture sensors & energy storage devices◼Recipient of NASA Trailblazer Award for R&D of Additive Electronics Manufacturing capabilities◼Recognized with NASA’s Graduate Fellowship Award ◼Led multiple engineering efforts to develop equipment, techniques, and materials used to improve additive electronics manufacturing capabilities which were awarded full project funding◼Co-developed additively manufactured perovskite photovoltaics and demonstrated viability of additively manufacturing for potential future use in space, resulting in a $2M NASA Early Career Initiative Project Award◼Supported NASA’s agency-wide In-Space Manufacturing effort terrestrially by designing and demonstrating methods for repairing and additively manufacturing avionics

Developed software in Python to analyze real-time radiation environments and predict damaging events for earth-orbiting satellites.Some Key Impacts Include:◼Demonstrated the efficacy of the software operating continually for 1-month, producing no false alarms & 2 traceable alarms◼Created radiation environment definitions for small cubeSAT projects; defined the average 95th and 99th percentile radiation environments for various cubeSAT projects based on planned orbits to enable the project to select electronics based on trading off cost and acceptable risk

Designed and built electrical test boxes to conduct accelerated lifetime testing on semiconductor devices.Some Key Impacts Include:◼Architected a 24-slot test fixture, set up multiplexing hardware, identified and mitigated the high harmonic oscillations associated with high part density◼Allowed the testing software to measure I-V curves for up to 24-devices without disrupting the accelerated lifetime test or adding any additional cabling