Performed advanced SEM and FIB materials characterization on thin film solar cells. Conducted failure analysis, design verification, and material property analysis on semiconductor materials and devices. Developed and implemented new techniques to achieve higher quality results, increase process efficiency, and expand tool capabilities. Generating comprehensive analysis and reports through combination of methods and tools. Operation of SEM, FIB, EDS, EBSD, CL, XRD, XRF, LA-ICPMS, and TRPL.

Conducted research on Gallium Oxide (Ga2O3) semiconductor material with the goal of understanding internal diffusion mechanisms and their impact on the conductivity and dopant compensation effects. Worked with a MATLAB model to simulate experimental FTIR data and generate best fits through statistical analysis to identify dopant concentrations and diffusion coefficients. Provided characterization analysis and training for team members and external groups. Additional experience using plasma sputtering chamber, furnaces, hand tools, and optical metrology equipment to carry out experiments.

Responsible for stocking PPE, handling chemicals, performing equipment maintenance, and providing customer service to ensure a safe and organized lab environment in a class 100/1000 clean room.

Performed materials characterization analysis for materials submitted by clients. Received professional training and hands-on experience using SEM, XRD, UTM, TGA, DSC, UV-Vis, PSD, Instron, BET, and mechanical polishing. Performed failure analysis, composition evaluation, and material property testing. Conducted independent project on Thin Film characterization using XRD and UV-Vis spectroscopy, and published the report on the company website.