Jan Lundgren Email & Phone Number

My main area of research is currently optical and X-ray based measurement systems. Specifically measuring the surface topography and the coating content of paper and paperboard, an industry that has importance locally around Sundsvall, but also nationally i Sweden and internationally.The research of surface topography has recently resulted in a spinoff company, OnTop Measurement AB, http://www.ontopm.com/, https://www.facebook.com/OnTopMeasurement. Previous research work has been in the field of Behavioral level Noise Coupling (BeNoC) simulation and of architectural design improvements for color X-ray. This also involves simulating on-chip noise coupling at a high design level and refine the noise coupling simulations as the design is refined to lower design levels.Specialties: Optical camera based measurement systems, Phase contrast imaging with industrial demands, behavioral level on-chip noise coupling simulation, machine vision, color x-ray architectures.

Listed skills include Wireless Sensor Networks, Optics, Image Processing, Measurement Systems, and 16 others.