Dr. J.W. McPherson is recognized internationally as an expert in Reliability Physics & Engineering. He has published over 200 papers on reliability, authored the Reliability Chapters for 4 Books, awarded 20 patents, and holds the title of Texas Instruments Senior Fellow Emeritus. He was a General Chairman of the IEEE International Reliability Physics Symposium and still serves on its Board of Directors. In 2004, Joe received the IEEE Engineer of the Year Award from the Texas Society of Professional Engineers. In 2006, he was the Chairman of the International Sematech Reliability Council. Joe is an IEEE Fellow and the Founder/CEO of McPherson Reliability Consulting, LLC. His semiconductor reliability expertise includes device-physics, design-in reliability, wafer-fabrication and assembly-related reliability issues. Several of the reliability models that are used today in the semiconductor industry are closely associated with his name. Most recently Dr. McPherson authored a reliability textbook which is widely used by students and practicing engineers: Reliability Physics and Engineering, Springer Publishing, 2010 with a 2nd Edition in 2013 and a 3rd Edition in 2019.

Reliability Expert in Semiconductor Device Design, Device Processing and Device Assembly