John M. Balas Email & Phone Number

Malta, New York

East Fishkill, New York

• Develop web-based applications designed to provide a diverse user base with quick, easy-to-use access to all sources of semiconductor production data contained in a multi-terabyte data warehouse. Tools assist in viewing baseline product performance and offer extensive drill-down capabilities for exploratory analysis, cross-area correlations, and problem root cause analysis. Built upon an open source software foundation, the application framework provides a comprehensive, low cost strategic solution for engineering analysis needs.• Designed a Common Charting Library which provides a standardized interface to a set of engineering analysis data visualization tools. Offering a function-rich toolset, the library facilitates cross-area data correlations and defect signal detection. The common framework is leveraged by a wide set of analysis tools, resulting in significant productivity gains for both end users as well as application developers.• Architected a layered approach to standardized reporting, balancing the functional objectives of dashboard-style and ad hoc analysis systems. Integrated a novel scripting capability for the easy capture and replay of routine analysis scenarios.• Developed an analysis environment which couples IC device design aspects with inline electrical test data to quantify design/layout impacts on product performance early in the development cycle.

Burlington, Vermont

• Designed DataView, a SAS-based semiconductor engineering analysis application which enables seamless real-time access to fab-wide data sources coupled with a comprehensive set of statistical analysis tools. Drove its development and evolution from a prototype for the IBM/Siemens Alliance into a strategic analysis tool used across IBM Systems and Technology Group (STG) and several global alliance partners to increase engineering productivity and enable yield learning activities.• Collaborated in the evolution of a DB2-based engineering analysis data strategy, strongly influencing the logical design of the strategy’s core database. Advocated for, and achieved, a synergy between data and applications, with a focus on performance, usability, and data quality.• Partnered with IBM Yorktown Research on the development of an automated data mining system supporting critical yield learning activities. The system was activated in 2007 for IBM’s 300mm fab and is currently monitoring its high volume products.• Contributed to IBM Microelectronics’ first registered commercial software offering (DB2 Data Warehouse and Engineering Analysis Applications) marketed through E&TS channels. Acted as a lead technical consultant and contributed to the development of the marketing proposal which led to the successful closure of a contract with an external client.• Managed the IBM STG / SAS Institute software relationship for both Windows desktop and AIX platform licenses. Achieved a $1.4M license savings in 2006 through direct contract negotiations with SAS, internal license re-balancing, and application architectural changes that allowed the removal of an MVS system license.

Burlington, Vermont

• Architected an integrated AIX engineering database and analysis tool suite for DRAM production data. Its infrastructure represented the first successful internal migration from an MVS mainframe environment and resulted in reduced operating costs and improved engineering productivity. The database became a model for future engineering data warehouse development, and the analysis tools were the launch platform of what has become the DataView application framework.

East Fishkill, New York

• Co-Architected the Application Supervisor for Technology Evaluation and Control (ASTEC) tool, a real-time photolithography modeling system which provided feed-forward data for litho sector control based on overlay and critical dimension measurements. Achieved significant rework reduction and improved litho yields with its implementation.

East Fishkill, New York

• Developed the SAS Aided Results Analysis (SARA) system, a data collection and analysis tool supporting new CMOS and Bipolar technology development. This leading edge system was one of the first capable of near real-time visualization of data streamed from multiple memory testers, resulting in improved engineering productivity and tester throughput.

Jersey City, New Jersey

• Tested incoming raw materials for purity and monitored the quality of a diverse set of onsite manufactured consumer products.• Balanced full-time employment with full-time pursuit of a Masters degree in Physics.

Master Of Science (M.S.), Applied Physics

Bachelor Of Science (B.S.), Chemistry / Chemical Biology

Activities and Societies: Tau Beta Pi, Stevens International Scholar, Undergraduate Projects in Technology and Medicine (UPTAM), American.