Tem Manager
Lab performs over 1000 TEM analyses each year to support R&D, manufacturing, yield and performance engineering, and F/A. We implement new microanalysis and imaging techniques, and carry out efforts for development for new methods of specimen preparation to meet the challenges presented by Moore’s Law. Expert in HRTEM, HAADF STEM, quanti EDX & line scans, mapping and principle component analysis, and EELS spectral imaging and GIF, tomography, Omniprobe, dual beam FIB, XRD, Disco saw, etc. Authored over 600 internal reports in the past six years and published 25 external publications while at Intel. Mentor for seven successful interns, all of whom went on to finish Ph.D.s and start successful careers, (four hired by Intel). Responsible for proliferating TEM’s at Intel (from just two in 1992 to eleven in 2008), first Field Emission TEM at Intel, first EELS at Intel, first Aberration Corrected TEM at Intel, as well as four TEM Room Builds and installations and one FIB installation.