• Expertise in ATE Test program development from scratch at wafer level (EWS) and on package parts.(Final Test/FT).• Expertise in various type of ATE tester such as V93K, Uflex, J750, PK2.• Expertise in several IPs testing such as SCAN, eFlash, SRAM, eFuse, RRAM, MTP, and knowledge in industrial standard JTAG.• Expertise in converting Test program from tester to tester. Exp: PK2 to V93K, PK2 to J750.• Multiple module and project ownership for WS/FT.• Analyze and implement test solutions to improve functionality, yield, repeatability, test time and performance.• Perform characterization across process, operating voltage, and temperature to support new product release, design marginality, and low yield improvement.• Debug and validate the failure test solutions by using shmoo, error map, pattern tool, signal analyzer, etc. to ensure the test solutions in good performance(test coverage, stability, test time).• Experienced in hardware design (probe card, load board, socket, etc.) to suit new product testing based on the hardware configuration/setup.• Experienced in developing and handling multi-sites test program development, max up to x78 sites.• Support R&D testing, DOE's testing proposal and execution, data analysis, paper publication.• Capable in prober (TEL) file setup including special index, control map (for multi-sites), tri-temp, sampling test etc.•