Leonard Berger Email and Phone Number

In-process and final inspections of cable assemblies, electronic racks, and breakout and test boxes. Electrical testing of cables and electronic racks.

Responsible for Reliability and Failure Analysis testing of all power management, low voltage, high voltage, and high current products. Maintained 5 automated testers, transferred and verified test programs, and wrote new test programs. Worked with multiple design centers to resolve test issues. Supervised one test engineer.Set up 5 ATE testers in Temecula for Reliability and FA testing for all IC and module products.Created over 25 new test programs for older products that were no longer in production to support customer failure analysis.Designed, fabricated, built, and tested a new socket adapter board within 30 hours to resolve a customer emergency.Reduced socket board change time by over 95% by designing an easily replaceable plug in test socket.Modified test programs and designed hardware to support tri-temp testing for automotive customers.Designed and set up a test program revision control system to reduce revision issues by over 90%.Set up a central network based test program database with over 300 test programs to ensure that all of the testers will load the same test program.Set up a tester and trained engineers to enable testing at the Japan FA lab to reduce turnaround time for Asian customers by 75%.Updated testing procedures to meet ISO 9001 and ISO 17025 standards.

Directed all read/write preamp test development for the Tustin design center. Managed a team of 4 test engineers in addition to doing test development.Developed test programs and test methods for mixed signal read/write preamps for hard drives.Developed standards and scheduled projects between 2 development and 3 production sites.Worked with design and product engineering teams to improve test program coverage.Presented test plan reviews at 3 major customer sites for new product introductions.

Designed hardware and software for mixed signal read/write preamps for Teradyne testers. Designed the first modular test hardware for read/write preamp devices with >1 GHz bandwidth. Optimized use of production testers by writing new test programs and converting test programs between 2 tester platforms.Reduced test development times by over 50% by using modular test programs.Saved over $75,000 by designing modular test hardware that could be used to test an entire family of devices.Developed over 60 new test programs for read/write preamp devices.Led a team to transfer all hardware and over 40 preamp test programs to a new test site in Taiwan to reduce test costs.Trained new test engineers within our group and brought them up to speed in test development.Supported wafer probe and final test for new read/write preamp devices.Updated procedures and documents for ISO 9001 certification to prepare for audits.