Matthew Arnone Email & Phone Number

Hawthorne, California, Us

Hawthorne, California, Us

Cupertino, California, Us

• Led the development of a component level production test test flow for NAND Flash devices that allowed the factory to save on rework costs by screening out problematic devices before they are soldered onto system MLBs.• Interfaced with cross-functional development teams to develop specifications for future NAND products and drove external vendors to provide characterization data to ensure compliance to these specifications.• Reviewed system MLB schematics to ensure proper NAND subsystem connectivity and the usage of best practices for power and signal integrity.• Led quarterly technical reviews with memory vendor's senior management to align their technical roadmaps to the requirements of Apple programs.

Cupertino, California, Us

• Qualified NAND Flash and NAND plus controller based devices from multiple vendors for inclusion into Apple’s mobile devices (iPhone, iPod, iPad, etc.).• Reproduced and debugged failures observed during qualification on Advantest T5781 ATE and drove external vendors for failure analysis and corrective action.• Developed end of life characterization flows to analyze the endurance and data retention of MLC/TLC based devices in comparison to the required specification.• Analyzed customer usage statistics from automated field reporting to determine whether adjustments to endurance specification are needed for future products.

Boise, Idaho, Us

• Developed and maintained characterization flows for NAND and NAND plus controller based products on the Nextest Magnum II platform.• Interfaced with product leads to isolate and replicate potential device issues and correlate failures discovered on other platforms.

Boise, Idaho, Us

• Tested DRAM/NAND devices on Advantest testers and developed programs, scripts, and web applications to support DRAM and NAND Flash characterization.