Applications Engineer - Strategic Accounts
CurrentMost relevant AFM applications for nanotools’ AFM probesBlue Line Carbon AFM Probes:For the most stringent demands of fully automated AFM metrology tools. Extremely tight specifications for all critical probe dimensions including mounting chip, cantilever and AFM tip for excellent probe to probe consistency. High density diamond-like carbon (HDC/DLC) AFM tips provide the industry's best cost per measurement and lower total cost due to fewer tip exchanges and higher throughput. We guarantee 100% quality control of every individual Blue Line AFM tip and provide online datasheets with the key probe characteristics extracted from NIST-traceable SEM measurements.HAR Trench Profiling:Extreme Aspect Ratio, High Aspect Ratio, HDC Fine Features, MCNTRoughness Measurements:Enhanced Resolution, Fast Scanning3D CD Metrology:T-shape-like 3D AFM tips for most advanced process monitoring. Fine Feature Control:HDC Fine Features, MCNT, Fast Scanning, EBD-TESPA ProbesGreen Line Carbon AFM Probes:Cost-effective AFM tip solutions for the most demanding investigations in research and science. Specially designed and fabricated for advanced applications where low tip-sample interactions, high resolution at improved reliability even in subjacent regions or accurately defined contact areas between AFM tip and sample are the main challenges.Life science:For biological applications, where finest structures and/or height information of thick, force-sensitive samples are the critical measurement parameters. High-Resolution AFM: For reliable and long-lasting roughness measurements, force-sensitive samples or dynamic processes on the molecular level.NanoIndentation: Spherical, axisymmetric AFM tips for precisely located, reproducible measurements without tip artefacts due to nano-roughness.
