Nancy Bunce Email and Phone Number
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Quality assurance engineering laboratory support for semiconductor, biotechnology, and medical device industries. My areas of expertise are materials science, characterization, surface analysis and failure analysis, with 5+ years of experience in research and development (R&D). Extensive use of high-tech computer controlled equipment for manufacturing, production, and research. Perform testing for materials used in microelectronics, ceramics, nanomaterials/nanotechnology, metallics, biomaterials. Maintain and troubleshoot advanced laboratory equipment and oversee install of new equipment. Prepare reports using Microsoft Word, Excel, and PowerPoint. Quality - Manufacturing 5S and ISO-9001 / TS-16949Contact information:nbuncetx@yahoo.comLab Protocols:Clean room procedures Wafer handling, contamination protocolsPrepare samples for testStatistical Process Control(SPC)Manage lab supply and inventoryPerform tests following proper methodology Scientific documentationLaboratory Education:35+ hours Chemistry including Analytical Chem,Organic Chem ,Chem Lab techniquesEquipment:Electron Microscopy(SEM), Optical Microscopy (Nikon)ToF-Sims- PHI (Physical Electronics)Time of Flight Secondary Ion Mass Spectrometer XPS-PHI 5000 VersaProbe with Ultraviolet Photoelectron Spectroscopy(UPS)Auger- PHI 670 Scanning Auger Nanoprobe FTIR- Thermo Nicolet 6700,Continuum Microscope VASE- Variable Angle Spectroscopic Ellipsometer -J.A Woollam AFM- Atomic Force Microscopy-Vecco Multimode SPM (Scanning Probe Microscope)Training /Development:Semiconductor Manufacturing TechnologyFluid Power Systems - Hydraulics, Vacuum Systems Introduction to MicroprocessorsFundamentals of Wet and Dry EtchFundamentals of PhotolithographyAFM for Semiconductor IndustryXPS Depth Profiling
Talent 101, Inc.
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- talent-101.com
- Employees:
- 27
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Quality Assurance EngineerTalent 101, Inc. Oct 2014 - PresentTexas Instruments, Inc. Dallas, TxQuality engineering laboratory support services in Physical Characterization Laboratory, Surface Analysis Laboratory. Auger Electron Microscopy (AES), X-Ray Diffractometry (XRD) ,Fourier Transformed Infrared Spectroscopy, (FTIR), Tof-Sims (Time of flight Secondary Ion Mass Spectrometry). -
Research ScientistUniversity Of North Texas Feb 2008 - Apr 2012Research Scientist- Center for Advance Research and Technology (CART).Analyzed materials used in microelectronics, ceramics, nanotechnology, metallics, biomaterials . Trained and mentored 40 + users on equipment and data reduction softwareMotivated users to learn new equipment by recommending new methods of analysis to facilitate solutions to complex problems Reduced learning time 50% by documenting procedures for operators using Microsoft Word and Microsoft Excel. Prepared reports for faculty and industry clients using Microsoft PowerPoint. Maximized instrument usage by monitoring SPC weekly improving data quality and reliability Collaborated with graduate students and professors resulting in two technical publications.Process Improvements Auger – Saved $10,000 using rebuilt pumps avoiding full pump replacement. Saved $2000 ordering supplies from non vendor sources. Upgraded instrument to enable analysis of dielectric materials.XPS – Increased XPS usage 20% by upgrading XPS with Ultraviolet Spectroscopy unit for work function measurements.AFM – Initiated repairs resulting in return of instrument from 0 to 100% service. Identified damaged electronic boards, adjusted vibration isolation table, set up statistical process control. FTIR – Increased usage by 40% using Smart Orbit attachment to facilitate analyses by reducing sample prep time to near zero for liquids, semiconductors, powders, bones, woods, and polymers. Ellipsometer – Set up Heat Cell unit and heat cell software which facilitated visiting students with their research projects. -
Engineering TechnicianTotal Technical Services(At Texas Instruments Inc.) Mar 2005 - Dec 2007Kilby Center, Dallas, TexasEngineering Technician - Failure analysis laboratory at Texas Instruments Kilby Center. Engineering, R&D, and Manufacturing ProjectsProvided ToF-Sims analyses for TI worldwide fabs supporting engineering and manufacturing. Performed 20+ analyses per day for organic and inorganic Analyzed contaminants from furnaces, implanters, hoods, ovens, ashers, mold compounds, backgrind tape, and corrosion. Evaluate wafer defects daily and photograph regions of interest using optical microscope.Assisted in R&D project for acquiring on aluminum and tungsten surfaces for metal contamination.Met cycle time by evaluating customer needs and suggesting alternate analysis methods.Provided 3 hour turn time on yield loss issues resulting in rapid return of equipment to production. Reduced pass down time by 5% between shifts by suggesting written traveler to monitor work flow. Trained and mentored 4 co-workers on data reduction software.
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Engineering TechnicianTexas Instruments Apr 2000 - Sep 2003Kilby Center, Dallas, TexasEngineering Technician - Failure analysis laboratory at the Kilby Center. Provided Time of Flight Secondary Ion Mass Spec (ToF-Sims) surface analysis for Texas Instruments worldwide fabs.Supported manufacturing/ production operations by providing priority analytical data to engineers. Logged entry of all incoming samples. Provided Failure Analysis reports using MS excel and MS Word. Reduced cycle time by documenting procedures for data acquisition. Mentored and trained co-workers on new data reduction software and instrumentation.R&D ProjectsPrepared specialized customer based chemical peak lists.Suggested ideas regarding functionality requirements for upgraded data reduction software. Identified and researched SPC data excursion associated with depth profile analysis. -
Research Technician IiTexas A&M Baylor College Of Dentistry Apr 1999 - Apr 2000Dallas, TexasResearch Technician II - (1 year grant position) BioMaterials Department,Research and Development.Data collection for mechanical and chemical adhesion studies of ceramics to CP titanium. Solved sample defect problem by identifying arcing problem in gold coat instrument. This reduced the amount of rejected samples and eliminated the need to repolish pitted surfaces.SEM and EDS analyses of metal/ceramic fracture surfaces.Instron mechanical testing, X-diffractometry, Vickers hardness test, and optical microscopy.
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Engineering TechnicianTexas Instruments Apr 1997 - Sep 1998Kilby Center, Dallas, TexasEngineering Technician - Lithography Branch SiTD at the Kilby Center. Designed process for surface imaging DUV resist patterning of 8” wafers for DRAM and Logic customers.Worked with engineers to develop metrology metric using thermawave optiprobe to maintain reproducibility of silylation tool.Qualified silylation tool and document procedures to verify process, tool performance, and SPC.SEM sample preparation and cross sections for process development.
Nancy Bunce Skills
Nancy Bunce Education Details
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Biology -
Monroe Community CollegeChemical Laboratory Technology
Frequently Asked Questions about Nancy Bunce
What company does Nancy Bunce work for?
Nancy Bunce works for Talent 101, Inc.
What is Nancy Bunce's role at the current company?
Nancy Bunce's current role is Quality Assurance Engineer.
What is Nancy Bunce's email address?
Nancy Bunce's email address is na****@****unt.edu
What schools did Nancy Bunce attend?
Nancy Bunce attended Suny Oswego, Monroe Community College.
What skills is Nancy Bunce known for?
Nancy Bunce has skills like Characterization, Materials Science, Scanning Electron Microscopy, Afm, Spectroscopy, Semiconductors, Failure Analysis, R&d, Ftir, Xps, Nanomaterials, Optical Microscopy.
Who are Nancy Bunce's colleagues?
Nancy Bunce's colleagues are Vardhaman Dandige, Gregory Rohde, Adrien Kingombe, Dennis Drake, Ebony Lucas, Victor Ruiz, Ken Kozak.
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