Our world is entering a new technological era. Data have arguably topped oil as the world's most valuable resource and AI has become so ubiquitous that it is now often referred to as the new electricity. No matter the size of your organization, it can and should benefit from the latest advances in data science. My mission is to leverage my extensive analytical background to make my clients reach their goals faster, more efficiently, and more accurately.

Built a business from scratch manufacturing and distributing packaged food items.Distributed to over 100 stores regionally.Set up an online store and conducted online marketing.

Development of the Cathodoluminescence and Electron Beam Induced Current techniques in an Aberration Corrected Scanning Transmission Electron microscope (AC-STEM). System constraints: Ultra-High-Vacuum (UHV) compatible, sub-Angstrom stability (drift and vibrations), Non-Magnetic, Sub-picoampere noiseDesign of an in-vacuum positioning stage for the signal collection mirrorDesign of a low-thickness (2mm), high collection angle (2.1 Str) collimating parabolic mirrorDesign of a triple shielded, low drift stage for ultra-low electrical noise in-situ measurementsBuilding and integration of the system into a VG 601 AC-STEMCoupling with a photomultiplier and a light spectrometerFull software control and instrumentation of the system

Investigating the defect insensitive light emission of InGaN Quantum Well based Blue Laser Diodes (supervision of Prof. Pierre Stadelmann)Nanoscale structural and optical study of group III nitride building blocks of solid-state lasers using nanoscale local techniques including:- (Scanning) Transmission Electron Microscopy ((S)TEM), in different modes (z-contrast, Weak Beam Dark Field...)- Cathodoluminescence in STEM- Energy Dispersive X-ray Spectroscopy (EDX) and Electron Energy Loss Spectroscopy (EELS)- Calculations and comparison with experiments

Visiting ASU's Electron microscopy group and research facility. Learned Electron holography and applied it to Group III nitride photonic structures.

Nanoscale structural and elemental analysis of semiconductor nano-crystals in high-k dielectric thin films using Transmission Electron Microscopy.Applications include flash memories.

- Work performed at the cross-functional unit of the factory- Optimizing of the clean-room monitoring system (Class 10, 100 and 1000), deriving new methods of contamination measurement and control using design of experiment's (DOE) Tagushi method- Simulation of the impact of contamination particles on the yield of semiconductor wafers