Software test for a SDR (software defined radio) based on SCA (software communications architecture)

• Defined, developed, documented and debugged DRAM wafer level test programs• Analyzed, developed and optimized wafer test coverage• Continuously optimized yield and synchronized test contents between products• Verified test programs and pattern pre-1st silicon using verilog and epic simulation• Evaluated and characterized new products from 1st silicon to mass production• Implemented test time reduction and developed new ideas to reduce the wafer level test costs• Experience in wafer level testing and repair of various DDR2 and GDDR3 products ranging from 256MBit to 1GBit• Product test engineer with solid ATE experience (Advantest T5571, T5377, T5375), writing and modifying program code and creating test pattern for production test and analysis• Approved as a member of the world wide DFT (design for test) group the Test Concept Document of upcoming products for the Cary development center• Mentor and trainer for several less experienced product engineering colleagues

• Developed wafer level pre-, postfuse and component test programs for memory devices based on FeRAM technology (non volatile memory); programmed and maintained the main program on an Advantest memory test system• Developed reliability test programs and new analysis methods for FeRAM based memory• Tested and analyzed FeRAM based memory• Developed various C programs tools under UNIX to analyze the date created by the test program: o Program to analyze the fail data and create a repair solution with fuse information o Program to create color coded bitmaps showing the signal distribution of a “0” or a “1” or the signal window; this was very useful to identify the quality of storage cells and to identify problems o Program to analyze shmoo data and create result files for statistical analysis o Program to create data files containing fail bitmap information for the Toshiba fail-bitmap display system o Developed several UNIX scripts to handle data files

• Wafer test program development on an Advantest T5571 for 128Mbit SDRAM devices