Associate Technical Lead
Improving application for classification of 'overlay metrology target designs' to provide nanoscale precision in photolithography processes.• Responsible for designing and developing features from scratch.• Fixing bugs and impact analysis.• Took initiatives to create end-to-end utility tools which helped SQC, System and Apps team in faster customer complaint resolution.Tech stack- WPF(C#,XAML), EF(SQL), akka.net(Actor model), autofac(DI), automapper(DTO mapping), refit(REST… Show more Improving application for classification of 'overlay metrology target designs' to provide nanoscale precision in photolithography processes.• Responsible for designing and developing features from scratch.• Fixing bugs and impact analysis.• Took initiatives to create end-to-end utility tools which helped SQC, System and Apps team in faster customer complaint resolution.Tech stack- WPF(C#,XAML), EF(SQL), akka.net(Actor model), autofac(DI), automapper(DTO mapping), refit(REST API), caliburn.micro(MVVM), Enterprise Architect(UML)https://www.kla-tencor.com/products/chip-manufacturing/metrology#archer Show less