Patrick GIRARD received a M.Sc. degree in Electrical Engineering and a Ph.D. degree in Microelectronics from the University of Montpellier, France, in 1988 and 1992 respectively. He is currently Research Director at CNRS (French National Center for Scientific Research) and works in the Microelectronics Department of the Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM) - France. From 2010 to 2014, he was Director of this Department, composed of about 100 people. He is now Director of the International Associated Laboratory « LAFISI » (French- Italian Research Laboratory on Hardware-Software Integrated Systems) created in 2013 by the CNRS and the University of Montpellier with the Politecnico di Torino, Italy. Since 2006, he is deputy director of the French scientific network dedicated to research in the fields of System-on-Chip, Embedded Systems and Connected Objects (SOC2), a network composed of 1400 researchers across the country. His research interests include all aspects of digital and memory circuit test and reliability, with emphasis on critical constraints such as timing and power. Robust design of neuromorphic circuits as well as machine learning for fault diagnosis are also part of his new research activities. He has served on numerous conference committees and is an Associate Editor of several IEEE journals (IEEE Transactions on Computers, IEEE Transactions on Emerging Topics in Computing, IEEE TET, JETTA Journal of Electronic Testing (Springer). He has supervised 45 PhD dissertations and has published 12 books or book chapters, about 100 journal papers, and more than 250 conference and symposium papers on these fields. Patrick Girard is a Fellow of IEEE.