Hiking 2579 miles in 130 days might look like an elaborate excuse to delay returning to work. It was, in part, and now I'm out of excuses.

I couldn't attempt the Pacific Crest Trail in 2020 because of the pandemic. In 2021, fire-related closures punched a northern-California-sized hole in my itinerary. Like a typical engineer, the project I thought would take a year ended up taking three.

• Developed data analysis and reporting routines for array reliability characterization.• Performed within-platform and cross-platform correlation of test methodologies.• Defined test-plans for collecting accelerated lifetime data.Software: Python, GitHardware: MicroMate (custom platform), TEL P12 wafer prober

• Developed and maintained test programs for NAND non-volatile (flash) memory.• Constructed emerging-memory reliability characterization test-flows.• Qualified “Burn-in” oven hardware, test-fixtures and process changes for packaged parts.• Worked with product and test engineers to debug production problems and reduce cost-of-test while maintaining product quality.• Supported local and overseas test sites during new product introductions and high-volume manufacturing.Software: Python, C++, SQL, Linux, SubversionHardware: Ambyx (custom platform), 1690AD logic analyzer, TDS3034C oscilloscope

• Developed test processes and programs to accelerate semiconductor yield improvement.• Tested software (unit, integration, regression) using semiconductor wafers and hardware fixtures.• Performed laboratory debug of test failures occurring at client sites.• Qualified advanced-design probecards to allow testing of latest technology nodes.• Developed technique to measure capacitance without an LCR meter.Software: C++, Linux, XML, Microsoft Visual StudioHardware: pdFasTest (custom tester), ETS-300 tester, TEL P12 wafer prober, Accretech UF3000 wafer prober, HP4285 LCR meter, HP3458 multimeter, HP4156 parameter analyzer, TDS7104 oscilloscope

• Developed semiconductor test and data analysis algorithms used for process monitoring.• Supported manufacturing team by quickly resolving test issues and clearly documenting operating procedures.• Worked closely with device and test engineers to address root-causes of complex semiconductor processing and testing problems.• Performed Failure Modes and Effects Analysis (FMEA) and Measurement Systems Analysis (MSA) in order to maintain QS9000 compliance.• Kept pace with an aggressive new product schedule by interpreting test specifications and implementing hardware functionality in software where possible.• Coordinated company-wide efforts to address common test issues and align functional libraries across test sites.• Reduced test-times while preserving test accuracy and reliability.• Minimized retest rate and maximized data quality by implementing and optimizing process controls.Software: C, UNIX, SAS,Hardware: Agilent 4072 tester, Keithley S400 & S600 testers, TEL P8 wafer prober, KLA 1201 wafer prober, HP4284 LCR meter, HP3458 multimeter, HP81110 pulse generator, HP4156 parameter analyzer, DSO8104 oscilloscope

• Designed, maintained and optimized production test programs and statistical analysis routines.• Performed hardware and software troubleshooting in order to maximize tester up-time and throughput. Addressed systematic root-causes to ensure continuous improvement of automated test equipment (ATE) processes.• Standardized test methodologies and combined product-specific programs into a single framework.• Member of cross-functional teams responsible for introducing two new technology nodes.• Key member of team responsible for implementing statistical process control (SPC) at parametric test.Software: UNIX, SAS, BASIC, PERL, HTMLHardware: HP4062 tester, KLA 1007 wafer prober, HP4284 LCR meter, HP4145 parameter analyzer

• Constructed 1D and 2D simulations of semiconductor devices and manufacturing processes.• Worked with device engineers to minimize the experimental design space necessary for proposed process changes.• Worked with process engineers to predict the effect of manufacturing excursions.TCAD Software: TMA Suprem-3, TSuprem-4, MediciHardware: HP4145 parameter analyzer