Robert Baumann

Robert Baumann Email and Phone Number

Director, Radiation Effects and Reliability @ The University of Texas at Dallas
Dallas, TX, US
Robert Baumann's Location
Dallas, Texas, United States, United States
Robert Baumann's Contact Details

Robert Baumann personal email

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About Robert Baumann

Technology consultant (www.radiositysolutions.com) focused on providing decisive reliability and radiation effects solutions for a wide variety of clients. Director of Radiation Effects and Reliability at Center for Harsh Environment Semiconductors and Systems (CHESS) at University of Texas at Dallas (UTD). IEEE Fellow and Texas Instruments Fellow (emeritus) with 35 years experience. Primary author of the Texas Instruments Radiation Handbook.Strong leadership, strategic planning and influencing skills, with a focus on mentoring and developing individuals and teams. Ability to present and explain complex concepts to a wide range of audiences.Internationally recognized radiation effects expert responsible for design/process optimizations, modeling, simulation, and radiation test campaigns. Active in international engineering organizations (IEEE), standards, and U.S. Government policy. Led the creation of and coauthored several international standards (JEDEC JESD-89, -89A, -221) and co-led SIA group that negotiated with U.S. Government to change ITAR export controls greatly reducing inadvertent capture of commercial electronics as munitions items.

Robert Baumann's Current Company Details
The University of Texas at Dallas

The University Of Texas At Dallas

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Director, Radiation Effects and Reliability
Dallas, TX, US
Robert Baumann Work Experience Details
  • The University Of Texas At Dallas
    Director, Radiation Effects And Reliability
    The University Of Texas At Dallas
    Dallas, Tx, Us
  • The University Of Texas At Dallas
    Director Of Radiation Effects And Reliability
    The University Of Texas At Dallas Jul 2022 - Present
    Dallas, Tx Usa
    Growing radiation effects capabilities for the newly-formed Center for Harsh Environment Semiconductors an Systems (CHESS). Have generated $5M in funding along with > $1M in equipment donations.
  • Radiosity Solutions
    Founder, Consultant
    Radiosity Solutions Aug 2018 - Present
    Dallas/Fort Worth Area
    Consultancy providing decisive solutions for a host of semiconductor technology and radiation effects challenges for terrestrial, industrial, and space applications. Radiosity Solutions (www.radiositysolutions.com) provides the following services:Consultation: For critical production challenges related to IC radiation effects and reliability.Training: Customized reliability/radiation effects courses from executive overviews to engineering deep-dives.Rad Test Campaign Support: Design-of-experiments, standards compliance, calculations and data interpretation, and the generation of publication-ready reports.
  • Smu Lyle School Of Engineering
    Adjunct Research Professor
    Smu Lyle School Of Engineering Oct 2018 - Oct 2022
    Dallas/Fort Worth Area
    Guiding research on several graduate and under-graduate projects at SMU in the area of radiation effects and reliability in power GaN devices in harsh environments. Built the foundations for a Harsh Environment Reliability Institute (Center for Ultra Reliable Electronics). Focused reliability assessments and new device development as well as working on building characterization capabilities.
  • Texas Instruments
    Chief Technologist, High Reliability Products
    Texas Instruments May 2012 - May 2018
    Dallas/Fort Worth Area
    Driving technology development of space power and robust ferroelectric memory (FRAM) for harsh environments targeting oil industry, industrial and avionics/satellite industries. Creating radiation models, simulation software and enhancing in-house radiation effects characterization capabilities. Assisting in marketing and product development strategies. Frequently consulted by other TI business units and external customers in the area of radiation effects and reliability.
  • Texas Instruments
    Technologist, Advanced Cmos Reliability Development Group
    Texas Instruments Feb 2000 - Apr 2012
    Dallas/Fort Worth Area
    Company radiation expert consulted regularly by customers and business units, world-wide on terrestrial radiation effects and reliability. Developed radiation characterization/modeling from 500nm - 16nm. Worked closely with packaging groups to develop and enable TI's Ultra Low Alpha (ULA) packaging solutions and metrology. Led SIA effort with ITAR Export controls. Personally responsible for 2006 change in SEU criterion that saved U.S. semi. industry billions in lost revenues from inadvertent export control. Leader & one of the primary authors of the JEDEC JESD89 and 89A test standard.
  • Texas Instruments
    Manager, 130Nm Cmos Reliability Development Group
    Texas Instruments Aug 1998 - Jan 2000
    Led reliability development on 130nm node, managing on-time delivery of Process Delivery Kit (PDK) reliability models, and test chip area/planning/PG. Directly responsible for modeling commercial radiation effects, and the creation of the industry's first on-line SEU estimator tool.
  • Texas Instruments
    Director - Advanced Failure Analysis Group
    Texas Instruments Dec 1995 - Jul 1998
    Tsukuba R&D Center
    Founded and led cutting-edge electrical/physical failure analysis group for TI manufacturing sites. Grew small "special forces" team (5 people) around advanced TEM and FIB capabilities to provide rapid-response/short-cycle time evaluations for fab-stop and priority customer field returns to enable rapid process and design solutions.
  • Ti Japan
    Engineer / Manager, Reliability Development Group
    Ti Japan Aug 1993 - Nov 1995
    Mihomura, Japan
    Led reliability group for 64-256Mb DRAM and Microprocessor technologies. Developed novel ring-oscillator AC channel hot carrier test structures that revolutionized reliability extrapolation, enabling TI DRAM and SUN products to hit aggressive performance (speed) goals by allowing significant over-drive (since CHC margin was correctly accounted for).
  • Texas Instruments
    Engineer, Dram Reliability Development Group
    Texas Instruments Jun 1989 - Jul 1993
    Dallas/Fort Worth Area
    Developed wafer-level reliability & fanned-out globally. Solved GOI DRAM issues. Worked with design/process engineers to enable soft error rate reductions (1000x). Did extensive alpha-particle studies and material assessments for optimizing SER. First to suggest (at TI) that neutrons dominated DRAM SER. Discovered dominant SER fail mode in semiconductors arising from reactions between cosmic background thermal neutrons and Boron-10 and patented solutions.

Robert Baumann Skills

Semiconductors Cmos Failure Analysis Semiconductor Industry Ic Characterization Silicon Electronics Reliability Analog Thin Films Asic Simulations Microelectronics Testing Process Integration Radiation Effects Mixed Signal Vlsi Debugging Integrated Circuits Spice Cross Functional Team Leadership Itar Mems Sram Computer Architecture Strategic Leadership Application Specific Integrated Circuits Very Large Scale Integration

Robert Baumann Education Details

Frequently Asked Questions about Robert Baumann

What company does Robert Baumann work for?

Robert Baumann works for The University Of Texas At Dallas

What is Robert Baumann's role at the current company?

Robert Baumann's current role is Director, Radiation Effects and Reliability.

What is Robert Baumann's email address?

Robert Baumann's email address is ro****@****las.edu

What schools did Robert Baumann attend?

Robert Baumann attended Rice University, Bowdoin College.

What skills is Robert Baumann known for?

Robert Baumann has skills like Semiconductors, Cmos, Failure Analysis, Semiconductor Industry, Ic, Characterization, Silicon, Electronics, Reliability, Analog, Thin Films, Asic.

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