Semiconductor Process Control Solutions Sales and Customer Support for Central and Western Region of North America Business Unit- Lead sales and account contact for all production throughput in-line inspection technologies including LS-SWIFT, Surfscan, ebeam, and BBP within territory.- Lead sales and account contact for all FaST division systems including both advanced inline films and optical cd metrology systems.

Selling Inline Defect Inspection, Review, and Metrology Equipment for the Semiconductor Industry

-Consistently outperformed sales quotas by achieving 128% of target duringPandemic year, and above plan performance in subsequent years.-Organized, prepared, and spoke at public facing quarterly key customerwebinars with 50-75 attendees-Served on corporate CRM expert council tasked with improving CRMperformance and utilization-Developed new CRM best practices for consistent follow up on 50-100 openopportunitiesOI Diamond award for going above and beyond to ensure key customersatisfaction in pandemic year by selling, installing, accepting, and training 7 separatecustomers in Texas area.

- Tailored Surface Analysis and Micro Analysis solutions to meet and exceed customer needs through deep understanding of customer's business and application- Covered southern United States sales territory for Surface Analysis and Micro Analysis business- Consistently met and exceeded sales targets- Awarded business unit level Intensity award for tenacity in pursuing and closing sales- Leveraged technical and managerial background to understand customer needs from detailed and personal perspective- Developed new CRM best practices for consistent follow up on 100+ open opportunities

- Scheduling of Applications trips, demos, etc- Management of 9+ engineers- Manage and participate in all Customer demos- Recruitment of new engineers- Manage factory testing and ensure shipment of quality systems on time- Ensure proactive customer communication by Apps team- Training and guidance for new and experienced engineers- Creation of new processes for increased efficiency and quality in System Test- Creation of new processes to optimize Customer demo performance- Manage and lead Applications development- All of the previous Applications Engineer responsibilities.

- Conduct product demonstrations on sub 22nm semiconductor devices to prove capabilities of sProber, dProber, and nProber nanomanipulator systems. - Test and troubleshoot each nanoprobing system to meet factory acceptance specifications. - Install, test, and prove capabilities of nanomanipulator systems at customer yield enhancement labs around the world.- Train customers on the following applications: > Operation of DCG nanoprobing systems > Parametric testing of SRAM, DRAM, Logic circuit, and a variety of test structures > Electron Beam Absorbed Current(EBAC) based FA > Electron Beam Induced Current(EBIC) based FA > Memory and logic circuit pulsing > Kelvin transistor and resistance measurement. > CV measurement- Present new and flagship applications to current and potential customers.- Write technical papers and application notes to further accessibility of nanoprobing techniques.- Answer customer questions relating to device analysis, nanoprober operation, and testing procedures.

- Conduct product demonstrations on sub 22nm semiconductor devices to prove capabilities of sProber, dProber, and nProber nanomanipulator systems. - Test and troubleshoot each nanoprobing system to meet factory acceptance specifications. - Install, test, and prove capabilities of nanomanipulator systems at customer yield enhancement labs around the world.- Train customers on the following applications: > Operation of DCG nanoprobing systems > Parametric testing of SRAM, DRAM, Logic circuit, and a variety of test structures > Electron Beam Absorbed Current(EBAC) based FA > Electron Beam Induced Current(EBIC) based FA > Memory and logic circuit pulsing > Kelvin transistor and resistance measurement. > CV measurement- Present new and flagship applications to current and potential customers.- Write technical papers and application notes to further accessibility of nanoprobing techniques.- Answer customer questions relating to device analysis, nanoprober operation, and testing procedures.

- Reduced and analyzed near-IR data from the planet Jupiter to model storm formation and evolution.- Wrote programs that allowed NASA scientists to analyze data from NACO (a VLT instrument) and UIST(a UKIRT instrument).