Lead RF IC, Subsystem Bring and Evaluation.Test Automation for Post Silicon and System validation.

Performing Bring up and evaluation of Beamformer ICs, Frequency Converters, Amplifiers (PA & LNA), OTA related measurements.Implementation of Automation Tool for conducting S Parameters, NF, EVM/ACPR, Gain Compression measurements for Beamformer ICs, Frequency Converters, and Amplifiers.Worked in system and sub-system level calibrations for conducted and over-the-air measurements for Gain Compressions, Phase-corrections, and EVM/ACPR for Phased-array terminals.Setting up Lab environment and management.

Performing Bring up and evaluation of RF DACs, ADCs and SOCs.Implementation of Calibration routines for Linear operation of DAC.On-site/Off-site Customer support to bring up DAC IP in customer's SOC.Deep understanding of High resolution and High-speed DAC/ADCs and their calibration systems.Experience in working on Spectrum Analyzers, Network Analyzers and various lab equipment.Implementation of Matlab/Python drivers for new lab equipment.

 SERDES validation performed across following networking 10GKR (Ethernet over backplane), Fiber Channel(16GFC,8GFC, 4GFC, 2GFC and 1GFC), QSFP+(DAC), SFP+(Optics), proprietary customer standards by ZTE, Cisco and storage standard PCIe Gen3/4, SATA/SAS Gen 1/2/3 Tested at high data rates (up to 16G). Testing requires complex setups with non-trivial delay calibration, detailed and comprehensive understanding of equipment features and capabilities. Experienced in DCD, TX jitter, FIR, swing, CTLE, VGA, DFE, jitter tolerance and eye measurements. Some experience with PLL and phase noise characterization. Understand the test methodology described in the standard, developing test measurement scripts as per the standard, performing setup calibration, writing instrument drivers. Performing s-parameter measurements using PNA ,Jitter measurement using spectrum analyzer, Sampling scope and real time scope Rise and fall time measurement, amplitude, post and pre cursor, eye mask ,measurements with and without de-embedding, common-mode measurements, measurements using Agilent advanced eye measurement tool, writing test scripts for the measurements as per the methodology described in standard. Test algorithms developed/modified – Receiver Jitter tolerance test, Receiver /interference tolerance test, Transmitter parameter measurement test. Test scripts were modified to reduce test time for Transmitter measurements Devised and automated test algorithms to investigate device functionality. Developed equipment drivers to achieve automation control over bench setup to facilitate complex, comprehensive and lengthy test runs. Developed software routines to facilitate data collection and analysis Leakage current measurement, PLL bandwidth peaking Measurement and power consumption measurement for various testchips. Interfaced across groups, sites and organizations to standardize testing, verify simulation data and lead debug efforts.

Developed validation suites for peripheral modules for dsPIC and PIC32 microcontrollers:SPI: Serial Peripheral InterfaceCTMU: Charge Time Measurement UnitI2C: Inter-Integrated CircuitRAMFLASH (NVM)USB (Universal Serial bus)OscillatorsDeveloped Enhanced Validation suiteDescription: To Automate the whole process of validation for legacy peripheral modules using LabVIEW and Microchip tools. This was recognized and certified by Microchip Team which reduced human intervention, lesser bench setups and faster silicon validation. Validation of these modules are performed under different voltage and temperature conditions.Developed Speed Test SuiteDescription: To find the performance of the dsPIC or PIC32 microcontrollers with respect to clock speeds, active currents, different operating voltages and temperaturesDeveloped Peripheral current measurementsDescription: To automate and find active current consumption of individual peripheral modules of the microcontroller under different voltages, temperatures and process corners.

Worked and designed Automated Data characterization system for PIC microcontrollers as part of my project work during MSc. The GUI measures, collects, tabulates and analyse the data points of different parameters of the AC & DC characteristics of Microcontroller.This project was recognized at top level management and continued to use as tool for characterization. This also helped me fetch Applications engineer position at the same company.