At Brookhaven National Laboratory, my focus is advanced material characterizations, development of polymeric and inorganic materials morphology control, developing new metrology tools and structure-property relations. Key Expertise:• Analytical Science & Materials Characterization: - Extensive experience with in-situ X-ray spectroscopy, microscopy, and light scattering characterization techniques (GISAXS, GIWAXS, SAXS, WAXS, DLS, FTIR, Raman, Ellipsometry, XRD, Profilometry) , microscopy characterization (SEM, TEM, HRTEM). - Specialized in data-driven analysis to inform process optimizations in thin-film coatings/deposition.• Experimental Design & Data Analysis: - Design and execution of complex experiments with a focus on critical data analysis and validation. - Use of systematic, data-driven approaches to enhance material performance and support product development decisions.• Precision Manufacturing: - Knowledgeable in DFM, rapid and traditional manufacturing, cleanroom protocols, and tooling for opto-mechanical assemblies. - GD&T analysis, 3D CAD designs, FMEA, and statistical methods for high-precision manufacturing.• Nanofabrication and related metrology: - PVD and CVD processes - Atomic layer deposition of metal oxides with ALD systems (Cambridge Nanotech Savannah100, Veeco S200), - Dry etch process development: RIE, ICP, and deep reactive ion etching (DRIE), (ULVAC and Oxford Instruments) - E-Beam Lithography (JEOL JBX-6300FS), SEM and FIB (Helios G5 Dual Beam SEM/FIB Microscope), Thin film sputter (Kurt J. Lesker PVD75), CVD systems.• Internal Consulting & Cross-Functional Collaboration: - Act as an SME on materials evaluation and process optimization. - Collaborate with cross-functional teams to provide data-informed solutions that align with R&D objectives.