-----------------------------------------EXPERTISE-----------------------------------------Pre-silicon reliability: Primarily focused on Electromigration (EM), with exposure to other reliability areas such as Gate Oxide Time Dependent Dielectric Breakdown (TDDB), Device Aging under Bias Temperature Instability (BTI) and Hot carrier injection (HCI). Programming: Advanced level expertise in programming (primarily in Python). Currently own several POR automation, regression, and QA flows and the associated infrastructure used for pre-silicon reliability assesment and signoff.Machine learning: Advanced level expertise in machine learning. Roughly 5 years of deep learning exposure in academia and industry, as well as from several personal projects.Circuit design and simulation: Moderate level expertise in circuit design and circuit simulation with industry standard EDA tools such as the Cadence ADE suite.-----------------------------------------RESEARCH-----------------------------------------PhD Thesis: Towards Addressing Thermal and Reliability Challenges in Nanometer Integrated Circuits.Master's Thesis: Accelerated Electromigration Wear-out Analysis for Nanometer ICsPlease find the full list of publications here: https://scholar.google.com/citations?hl=en&user=PaVqHDgAAAAJ-----------------------------------------PATENTS-----------------------------------------Utility patent (US10754527B2) – Recording eraser and the associated sensor-fusion technology. https://patents.google.com/patent/US10754527B2/en
Listed skills include Matlab, Vhdl, Labview, C, and 19 others.