• More than 20 years strong experience in reliability & related functions: FTA, (D/P)FMEA, DfX, EVT/DVT, data analysis, ORT/ORM, process/product qualification, gauge R&R, SPC, DOE, burn-in, reliability demonstration test, HASS, HAST, HALT, & Quantitative ALT. Quality Measure: IQC, TQM/QMS, CAR/PAR, 6-sigma, & 8D.• Converted customer specification into reliability testing/qualification matrix, requirement, & test plan. FA of testing fallout, worked with cross functional team for risk mitigation, reliability growth, & issues final reports. • Reliability methodology development. Determine accelerating stress & techniques, destruction limit, induced artifact failure, latent defect, pass criteria, time to failure, degrading mechanism, & cycle/combine/step-wise tests.• Statistical reliability data analysis, modeling, & prediction using Weibull++, Minitab, JMP for reliability/lifetime parameters: distribution (pdf/cdf), BX% life, constant & wearout failure rate, MTTF/MTBF, scale/shape factor, Arrhenius function, apparent activation energy, time to failure, & degradation model.• Established reliability labs capable of optical, mechanical, electrical, environmental, & chemical stress test, worked with other departments for soft/firm/hard-ware, data, control, & automation of test vehicle/fixture.• Developed new test techniques, analytical tools, & hand on reliability testing of optoelectronics, opto-mechanical, electromechanical, electronics, materials, tribology, mechanical, optical coating, thin film, PCBA, semiconductor laser, solder joint, packaging, interface, & corrosion, in material, device, assembly, module, sub-, & system level.• Continuously evaluated field data to adjust reliability test/variables to reduce customer return and warranty cost.• Worked with MIL, Telcordia, JEDEC/JEP122G, IPC, ISTA, SID, CIE, & IEC, ASTM, ASQ, IEEE standard.• Established reliability metrics of product, RMA, field data, & tractability to support sales & marketing staff.
Listed skills include Failure Analysis, Thin Films, Characterization, Design Of Experiments, and 20 others.