I have hand-on experience and knowledge on following areas: • Soft error analysis, test, mitigation, and technical training to improve reliability• Fault injection techniques and tools for dependability bench-marking and reliability assessment• Various simulation based analysis and test method to identify soft error issues from field• Soft error analysis and test solutions, from transistor to system level• Soft error rate estimation with predictive analysis, simulation, accelerated test, and fault injection• DFT and DFR techniques to test and measure di/dt and noise related soft error rate.• HW, DFT, scan, and JTAG security protection for SoC, SiP, and AP• Hold 12 US patents on DFT, soft error, scan, JTAG, and fault injectionIn summary, my specialties are:Soft error analysis / test / mitigation, SEU (single event upset) characterization, DFT / DFR technologies, DFT / JTAG / scan security protection for reliability assessment and improvement.
Listed skills include Asic, Dft, Simulations, Semiconductors, and 11 others.