Dr. Thomas W. Williams is a Consultant in the area of Electronic Design Automation. Prior to that he was a Synopsys Fellow at Synopsys in Boulder, Colorado, U.S.A. Formerly, he was with IBM Microelectronics Division and manager of the VLSI Design for Testability group. He received a B.S.E.E. from Clarkson University, an M.A. in pure mathematics from the State University of New York at Binghamton, and a Ph.D. in electrical engineering from Colorado State University. He has received numerous best paper awards from the IEEE and ACM, is the founder or co-founder of a number of workshops and conferences dealing with testing. Dr. Williams has previously served on the Computer Society Board of Governors and the IEEE Board of Directors. He is a member of the Eta Kappa Nu, Tau Beta Pi, IEEE, ACM, Sigma Xi, and Phi Kappa Phi. He is an Adjunct Professor at the University of Calgary, Calgary, Alberta, Canada; and in 1985 and 1997, he was a Guest Professor and Robert Bosch Fellow at the Universitaet of Hannover, Hannover, Germany. He was recently honored as a foreign member of the Chinese Academy of Science. Dr. Williams was named an IEEE Fellow in 1988 and received the Computer Society's W. Wallace McDowell Award for outstanding contributions to the computer art in 1989. In 2007 Dr. Williams received the European Design and Automation Association Lifetime Achievement Award. In 2010 Dr. Williams received the Distinguished Alumni Award Colorado State University, College of Engineering. That same year he also received the IEEE TTTC Lifetime Contribution Medal. In 2019 Dr. Edward B. Eichelberger and Dr. Williams received the 2019 ACM/IEEE A. Richard Newton Technical Impact Award in Electronic Design Automation. In 2018 he received the Phil Kaufman Award, “The Nobel Prize” of Semiconductor Industry, “Dr. Williams is being honored for his overall impact on the electronics industry through contributions to scan Design for Testability and related test automation.”