Acts as agent project leader during half year (Jan-Jun 2011), leading 3 team members, and responsible for co-work with production workers, QA, business and PM. Solve the flatness problem of the light source in spectro-radiometer project, and publish a patent.Improve the measurement speed in the imaging colorimeter project, and publish a patent. Solve the polarization problem in color analyzer project, and publish a patent. Solve the uniform problem of the light source in lux meter project, and publish a patent. Represent Chroma to draft the SEMI and CIE standards (2009-now) in ITRI, which consist of light bar, color breakup, electronic paper, 3D display and 3D gray to gray task force.

Associate engineer, Center for Measurement Standards /ITRI Oct 2003-Mar 2006 Leader of patent map group for overlay and thin film metrology, 2003-2005 Participate in overlay metrology in wafer project, publish a conference paper and Co-author of two conference papers. Cooperate with Accent company, maintain the scatterometer to measure the overlay and CD in wafer, design the overlay pattern, and develop the algorithm(RCWA) to measure the overlay. Measure optical constants in thin film by using imaging spectrometer and fiber to achieve high speed, high resolution and accuracy. Responsible for the algorithm of optical constants in thin film, design the optical system and plan the patent map. Propose the forward-looking project and patent. Cooperate with Chroma to design lux meter for measure LED optical constants. To design the lux meter (f1’<4%) to reach international industry standards.Associate engineer, Display Technology Center /ITRI Mar 2006-Fri 2008 The leader for forward-looking project in 2007:The metrology for high speed optical and electronic properties of different curvature in flexible display First author of two international journal papers and six international conference papers. The Annual Outstanding Journal by ITRI(“A Novel Driving Method and Device to Reduce Color Breakup for the Color Sequential Displays”, Journal SID 2008) The patent committee member of DTC/ITRI, and responsible for the patent map in color sequential displays. Maintain the TAF laboratory and is responsible for the quality in laboratory. Co-work projects and training two software engineer.