Worked on multiple projects on Web design and Game development. Majorly focusing on Unity3D.

Worked in real time process control software and several wafer meterology tools. Developed many high impact features and handled customers across various time zones.

Developed a standalone defect classification feature for an existing process control software. This software detects yield killing defects caused during semi conductor wafer manufacturing and classifies them. These results are used by chip manufacturing industries to visualize defects and calibrate their hardware for high throughput. This is purely developed in C++ for a real time inspection tool, which is in production across various geographical locations.