I'm currently focused on developing methods for imaging electronic and thermal signals in nanoscale devices, including semiconductor and next-generation memory systems. Despite the unparalleled resolution achievable with electron microscopy, TEM contrast primarily comes from a sample's physical structure - the type, number, and arrangement of atoms. Often times, especially when studying device physics, the physical properties are of secondary interest to the electronic and thermal dynamics at play. At NEI I am working to develop new techniques, using STEM EBIC, to reveal electronic and thermal contrast at high resolution to complement TEM'S physical contrast. For all publications please see my Google Scholar profile:https://scholar.google.com/citations?user=pj5h9FAAAAAJIn the past I have also been involved in DNA sequencing with graphene nanopores, developing techniques for graphene growth, and Raman spectroscopy on graphene-based devices.