Metrology Engineer
• Collaborated with the Augmented Reality Product Development and Engineering teams to perform innovative, complex scientific research, designed, developed, and created new AR products & features• Ensured AR products and features provided a high-quality, immersive experience to exceed the customers’ needs• Designed, fabricated, and tested products to ensure the highest standards of quality, safety, reliability, and performance• Delivered accurate measurements, results analysis, and… Show more • Collaborated with the Augmented Reality Product Development and Engineering teams to perform innovative, complex scientific research, designed, developed, and created new AR products & features• Ensured AR products and features provided a high-quality, immersive experience to exceed the customers’ needs• Designed, fabricated, and tested products to ensure the highest standards of quality, safety, reliability, and performance• Delivered accurate measurements, results analysis, and reports for diverse projects such as Apollo, Midas, and MLX• Performed SEM analysis to determine nano-feature geometry and conducted statistical analysis to draw actionable conclusions on critical dimensions, duty cycle, side wall angle, and nano-scale defects• Conducted AFM measurements for surface roughness, grating structures, and nanomechanical properties of thin films• Developed and optimized recipes for AFM AutoMET, configuring the AFM AutoMET software tailored to the application's needs, reducing the time required for critical dimension and height measurements by 75%• Led the installation of EDS, uXRF and the relocation of AFM and conducted training for AFM, SEM, EDS and uXRF etc.• Utilized EDS and uXRF to analyze material composition and analyzed surface energy on fused silica wafers using KRUSS• Collaborated with Process Engineers to identify & eliminate defective modes & generated reports on metrology findings• Modified Python code for SEM image CD and pitch, significantly improving efficiency and accuracy of image analysis • Performed optical defect inspections on wafers post-lithographic process to determine nanoscale defect rates• Evaluated imprinting resists with low / high refractive index using SEM & AFM• Maintained lab tools, selected new tools, developed working relationships with vendors, and coordinated vendors for project management and contract renewals• Created and maintained Standard Operating Procedures including SEM, AFM, EDS and microXRF Show less