• Investigating various gettering processes for epitaxially grown Si wafers• Implementing TOPCON contacts on various silicon based materials to observe the gettering and passivation• Utilizing deposition techniques such as ALD, APCVD, and PECVD to deposit thin layers of material onto substrates.• Working in a clean room and using various wet-chemical processes• Knowledge of Electrical, optical characterization and material analysis techniques• Analysis and visualization of data using Python

• Worked on sheet resistance calculation of thin films using a micro four-point probe.• Prepared the samples by cutting the wafers and getting rid of impurities before the experiment.• Installed, tested and documented the set-up for carrying out the micro four-point probe measurements.• Took the measurements for a particular period of time and designed a software to automate this process.• Compared the results with the values of conventional four-point probe measurements taken inside a clean room.• Reviewed and abided by all regulatory and compliance requirements in all experiments.• Documented and presented the results using MS Word and Latex.